A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results
Tromp, R.M., Hannon, J.B., Wan, W., Berghaus, A., Schaff, O.
Published in Ultramicroscopy (01.04.2013)
Published in Ultramicroscopy (01.04.2013)
Get full text
Journal Article
Back Illuminated Photo Emission Electron Microscopy (BIPEEM)
Moradi, Amin, Rog, Matthijs, Stam, Guido, Tromp, R.M., van der Molen, S.J.
Published in Ultramicroscopy (01.11.2023)
Published in Ultramicroscopy (01.11.2023)
Get full text
Journal Article
Design of a new photo-emission/low-energy electron microscope for surface studies
Get full text
Journal Article
Conference Proceeding
A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design
Tromp, R.M., Hannon, J.B., Ellis, A.W., Wan, W., Berghaus, A., Schaff, O.
Published in Ultramicroscopy (01.06.2010)
Published in Ultramicroscopy (01.06.2010)
Get full text
Journal Article
Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis
de Jong, T.A., Kok, D.N.L., van der Torren, A.J.H., Schopmans, H., Tromp, R.M., van der Molen, S.J., Jobst, J.
Published in Ultramicroscopy (01.06.2020)
Published in Ultramicroscopy (01.06.2020)
Get full text
Journal Article
Hot Electron Emission Lithography: a method for efficient large area e-beam projection
Get full text
Journal Article
Conference Proceeding
A Photopatternable Pentacene Precursor for Use in Organic Thin-Film Transistors
Weidkamp, Kevin P, Afzali, Ali, Tromp, Rudolf M, Hamers, Robert J
Published in Journal of the American Chemical Society (13.10.2004)
Published in Journal of the American Chemical Society (13.10.2004)
Get full text
Journal Article