by Nordholz, P., Treytnar, D., Otterstedt, J., Grabinski, H., Niggemeyer, D., Williams, T.W.
Published in Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) (1998)

by Arz, U., Williams, D.F., Walker, D.K., Rogers, J.E., Rudack, M., Treytnar, D., Grabinski, H.
Published in 2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017) (2000)

by Rudack, M., Redeker, M., Treytnar, D., Mende, O., Herrmann, K.
Published in Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2000)

by Nordholz, P., Grabinski, H., Treytnar, D., Otterstedt, J., Niggemeyer, D., Arz, U., Williams, T.W.
Published in Proceedings Design, Automation and Test in Europe (1998)

by Nordholz, P., Grabinski, H., Treytnar, D., Otterstedt, J., Niggemeyer, D., Arz, U., Williams, T. W.
Published in Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe; 23-26 Feb. 1998 (23.02.1998)

by Adler, A, Aminalai, A, Aschenbeck, J, Mayr, M, Drossel, R, Schröder, A, Scheel, M, Treytnar, D, Roll, S, Gauger, U, Stange, G, Simon, F, Rösch, T
Published in Zeitschrift für Gastroenterologie (03.08.2010)

by Adler, A, Aminalai, A, Aschenbeck, J, Mayr, M, Drossel, R, Schröder, A, Scheel, M, Treytnar, D, Gauger, U, Simon, F, Giannakoulopoulou, E, Wiedenmann, B, Rösch, T
Published in Endoskopie heute (09.03.2010)

by Mende, O., Redeker, M., Rudack, M., Treytnar, D.
Published in Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2000)