by Hass, K.J., Treece, R.K., Giddings, A.E.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1989)

by Wunsch, T.F., Hash, G.L., Hewlett, F.W., Treece, R.K.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1991)

by Sexton, F.W., Corbett, W.T., Treece, R.K., Hass, K.J., Hughes, K.L., Axness, C.L., Hash, G.L., Shaneyfelt, M.R., Wunsch, T.F.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1991)

by Hass, K.J., Treece, R.K., Giddings, A.E.
Published in IEEE transactions on nuclear science (01.12.1989)

by Wunsch, T.F., Hash, G.L., Hewlett, F.W., Treece, R.K.
Published in IEEE transactions on nuclear science (01.12.1991)

by Sexton, F.W., Treece, R.K., Hass, K.J., Hughes, K.L., Hash, G.L., Axness, C.L., Buchner, S.P., Kang, K.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1990)

by Fritzemeier, R.R., Soden, J.M., Treece, R.K., Hawkins, C.F.
Published in Proceedings. International Test Conference 1990 (1990)

by Soden, J.M., Treece, R.K., Taylor, M.R., Hawkins, C.F.
Published in Proceedings. 'Meeting the Tests of Time'., International Test Conference (1989)