Experimental Measurements of Constriction Resistance for Electrical Contacts Simulated Using Microfabrication
Fukuyama, Yasuhiro, Sakamoto, Norihiko, Kondo, Takaya, Toyoizumi, Jun, Yudate, Takahiro, Kaneko, Nobu-Hisa
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.06.2018)
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.06.2018)
Get full text
Journal Article
ELECTRICAL CONNECTION DEGRADATION DIAGNOSING DEVICE AND DEGRADATION DIAGNOSING METHOD
TOYOIZUMI JUN, ITO YOSHITAKA, KANEKO NOBUHISA, KONDO TAKAYA, FUKUYAMA YASUHIRO
Year of Publication 09.01.2020
Get full text
Year of Publication 09.01.2020
Patent
Evaluation of Degradation Degree of Plated Base Metal Contacts by Impedance Measurement
Fukuyama, Yasuhiro, Toyoizumi, Jun, Itou, Yoshitaka, Kondo, Takaya, Kaneko, Nobu-Hisa
Published in 2018 IEEE Holm Conference on Electrical Contacts (01.10.2018)
Published in 2018 IEEE Holm Conference on Electrical Contacts (01.10.2018)
Get full text
Conference Proceeding