Estimation of RF performance from LF measurements: Towards the design for reliability in RF-MEMS
Torres Matabosch, N., Kaynak, M., Coccetti, F., Wietstruck, M., Tillack, B., Cazaux, J.L.
Published in Microelectronics and reliability (01.09.2012)
Published in Microelectronics and reliability (01.09.2012)
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Journal Article
Conference Proceeding
Failure analysis and detection methodology for capacitive RF-MEMS switches based on BEOL BiCMOS process
Torres Matabosch, N., Coccetti, F., Kaynak, M., Espana, B., Tillack, B., Cazaux, J.L.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding
An accurate and versatile equivalent circuit model for RF-MEMS circuit optimization in BiCMOS technology
Torres Matabosch, N., Coccetti, F., Kaynak, M., Zhang, W., Tillack, B., Plana, R., Cazaux, J. L.
Published in 2012 7th European Microwave Integrated Circuit Conference (01.10.2012)
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Published in 2012 7th European Microwave Integrated Circuit Conference (01.10.2012)
Conference Proceeding