Reliability simulation for analog ICs: Goals, solutions, and challenges
Toro-Frías, A., Martín-Lloret, P., Martin-Martinez, J., Castro-López, R., Roca, E., Rodriguez, R., Nafria, M., Fernández, F.V.
Published in Integration (Amsterdam) (01.09.2016)
Published in Integration (Amsterdam) (01.09.2016)
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Journal Article
Circuit reliability prediction: challenges and solutions for the device time-dependent variability characterization roadblock
Nafria, M., Diaz-Fortuny, J., Saraza-Canflanca, P., Martin-Martinez, J., Roca, E., Castro-Lopez, R., Rodriguez, R., Martin-Lloret, P., Toro-Frias, A., Mateo, D., Barajas, E., Aragones, X., Fernandez, F. V.
Published in 2021 IEEE Latin America Electron Devices Conference (LAEDC) (19.04.2021)
Published in 2021 IEEE Latin America Electron Devices Conference (LAEDC) (19.04.2021)
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Conference Proceeding
A fast and accurate reliability simulation method for analog circuits
Toro-Frias, A., Castro-Lopez, R., Roca, E., Fernandez, F. V., Martin-Martinez, J., Rodriguez, R., Nafria, M.
Published in 2015 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.09.2015)
Published in 2015 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.09.2015)
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Conference Proceeding
Layout-aware Pareto fronts of electronic circuits
Toro-Frias, A., Castro-Lopez, R., Roca, E., Fernandez, F. V.
Published in 2011 20th European Conference on Circuit Theory and Design (ECCTD) (01.08.2011)
Published in 2011 20th European Conference on Circuit Theory and Design (ECCTD) (01.08.2011)
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Conference Proceeding
Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator
Toro-Frias, A., Saraza-Canflanca, P., Passos, F., Martin-Lloret, P., Castro-Lopez, R., Roca, E., Martin-Martinez, J., Rodriguez, R., Nafria, M., Fernandez, F. V.
Published in 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2019)
Published in 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2019)
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Conference Proceeding
A size-adaptive time-step algorithm for accurate simulation of aging in analog ICs
Martin-Lloret, P., Toro-Frias, A., Martin-Martinez, J., Castro-Lopez, R., Roca, E., Rodriguez, R., Nafria, M., Fernandez, F. V.
Published in 2017 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2017)
Published in 2017 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2017)
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Conference Proceeding
Lifetime Calculation Using a Stochastic Reliability Simulator for Analog ICs
Toro-Frias, A., Martin-Lloret, P., Martinez, J., Castro-Lopez, R., Roca, E., Rodriguez, R., Nafria, M., Fernandez, F. v.
Published in 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.07.2018)
Published in 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.07.2018)
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Conference Proceeding
A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation
Diaz-Fortuny, J., Saraza-Canflanca, P., Toro-Frias, A., Castro-Lopez, R., Martin-Martinez, J., Roca, E., Rodriguez, R., Fernandez, F.V., Nafria, M.
Published in 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.07.2018)
Published in 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.07.2018)
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Conference Proceeding
Automated Massive RTN Characterization Using a Transistor Array Chip
Saraza-Canflanca, P., Diaz-Fortuny, J., Toro-Frias, A., Castro-Lopez, R., Roca, E., Martin-Martinez, J., Rodriguez, R., Nafria, M., Fernandez, F. V.
Published in 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.07.2018)
Published in 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.07.2018)
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Conference Proceeding
Including a stochastic model of aging in a reliability simulation flow
Toro-Frias, A., Martin-Lloret, P., Castro-Lopez, R., Roca, E., Fernandez, F. V., Martin-Martinez, J., Rodriguez, R., Nafria, M.
Published in 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.06.2017)
Published in 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.06.2017)
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Conference Proceeding
CASE: A reliability simulation tool for analog ICs
Martin-Lloret, P., Toro-Frias, A., Castro-Lopez, R., Roca, E., Fernandez, F. V., Martin-Martinez, J., Rodriguez, R., Nafria, M.
Published in 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.06.2017)
Published in 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.06.2017)
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Conference Proceeding