High-temperature reliability of Ni/Nb ohmic contacts on 4H-SiC for harsh environment applications
Van Cuong, Vuong, Ishikawa, Seiji, Maeda, Tomonori, Sezaki, Hiroshi, Yasuno, Satoshi, Koganezawa, Tomoyuki, Miyazaki, Takamichi, Kuroki, Shin-Ichiro
Published in Thin solid films (01.01.2019)
Published in Thin solid films (01.01.2019)
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Journal Article
500 °C high-temperature reliability of Ni/Nb ohmic contact on n-type 4H-SiC
Van Cuong, Vuong, Sato, Tadashi, Miyazaki, Takamichi, Meguro, Tatsuya, Ishikawa, Seiji, Maeda, Tomonori, Sezaki, Hiroshi, Kuroki, Shin-Ichiro
Published in Japanese Journal of Applied Physics (01.03.2022)
Published in Japanese Journal of Applied Physics (01.03.2022)
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Journal Article
Characterization of Ba-Introduced Thin Gate Oxide on 4H-SiC
Kuroki, Shinichiro, Maeda, Tomonori, Muraoka, Kosuke, Ishikawa, Seiji, Sezaki, Hiroshi
Published in Materials science forum (19.07.2019)
Published in Materials science forum (19.07.2019)
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Journal Article
Influence of Ni and Nb thickness on low specific contact resistance and high-temperature reliability of ohmic contacts to 4H-SiC
Van Cuong, Vuong, Ishikawa, Seiji, Maeda, Tomonori, Sezaki, Hiroshi, Yasuno, Satoshi, Koganezawa, Tomoyuki, Miyazaki, Takamichi, Kuroki, Shin-Ichiro
Published in Japanese Journal of Applied Physics (01.11.2019)
Published in Japanese Journal of Applied Physics (01.11.2019)
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Journal Article
Thickness dependencies of SiO2/BaOx layers on interfacial properties of a layered gate dielectric on 4H-SiC
Muraoka, Kosuke, Ishikawa, Seiji, Sezaki, Hiroshi, Tomonori, Maeda, Yasuno, Satoshi, Koganezawa, Tomoyuki, Kuroki, Shin-Ichiro
Published in Materials science in semiconductor processing (01.01.2021)
Published in Materials science in semiconductor processing (01.01.2021)
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Journal Article
CF4:O2 surface etching for the improvement of contact resistance and high-temperature reliability in Ni/Nb ohmic contacts on n-type 4H-SiC
Van Cuong, Vuong, Miyazaki, Takamichi, Ishikawa, Seiji, Maeda, Tomonori, Sezaki, Hiroshi, Yasuno, Satoshi, Koganezawa, Tomoyuki, Kuroki, Shin-Ichiro
Published in Japanese Journal of Applied Physics (29.04.2020)
Published in Japanese Journal of Applied Physics (29.04.2020)
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Journal Article
Optimization of Ni/Nb Ratio for High-Temperature-Reliable Ni/Nb Silicide Ohmic Contact on 4H-SiC
Yasuno, Satoshi, Koganezawa, Tomoyuki, Kuroki, Shinichiro, Sezaki, Hiroshi, Maeda, Tomonori, Cuong, Vuong Van, Ishikawa, Seiji
Published in Materials science forum (19.07.2019)
Published in Materials science forum (19.07.2019)
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Journal Article
Suppression of Short-Channel Effects in 4H-SiC Trench MOSFETs
Zetterling, Carl-Mikael, Östling, Mikael, Ohshima, Takeshi, Makino, Takahiro, Maeda, Tomonori, Ishii, Tomoyasu, Kuroki, Shinichiro, Ishikawa, Seiji, Sezaki, Hiroshi
Published in Materials science forum (19.07.2019)
Published in Materials science forum (19.07.2019)
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Journal Article
Conference Proceeding
Low-Parasitic-Capacitance Self-Aligned 4H-SiC nMOSFETs for Harsh Environment Electronics
Kurose, Tatsuya, Ohshima, Takeshi, Ishikawa, Seiji, Makino, Takahiro, Sezaki, Hiroshi, Östling, Mikael, Kuroki, Shinichiro, Maeda, Tomonori, Zetterling, Carl-Mikael
Published in Materials Science Forum (05.06.2018)
Published in Materials Science Forum (05.06.2018)
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Journal Article
4H-SiC Trench pMOSFETs for High-Frequency CMOS Inverters
Ohshima, Takeshi, Ishikawa, Seiji, Makino, Takahiro, Sezaki, Hiroshi, Östling, Mikael, Kuroki, Shinichiro, Inoue, Jun, Maeda, Tomonori, Zetterling, Carl-Mikael
Published in Materials science forum (19.07.2019)
Published in Materials science forum (19.07.2019)
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Journal Article
Conference Proceeding
Effects of CF4 Surface Etching on 4H-SiC MOS Capacitors
Sezaki, Hiroshi, Kuroki, Shinichiro, Kobayakawa, Kiichi, Ishikawa, Seiji, Muraoka, Kosuke, Maeda, Tomonori
Published in Materials science forum (05.06.2018)
Published in Materials science forum (05.06.2018)
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Journal Article
4H-SiC pseudo-CMOS logic inverters for harsh environment electronics
Kuroki, S.-I, Kurose, T., Nagatsuma, H., Ishikawa, S., Maeda, T., Sezaki, H., Kikkawa, T., Makino, T., Ohshima, T., Östling, M., Zetterling, C.-M
Published in 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) (15.05.2017)
Published in 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) (15.05.2017)
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Conference Proceeding
Journal Article
Characterization of 4H-SiC nMOSFETs in Harsh Environments, High-Temperature and High Gamma-Ray Radiation
Makino, Takahiro, Ohshima, Takeshi, Zetterling, Carl-Mikael, Ishikawa, Seiji, Sezaki, Hiroshi, Kikkawa, Takamaro, Östling, Mikael, Nagatsuma, Hirofumi, Kuroki, Shinichiro, De Silva, Wijemuni, Maeda, Tomonori
Published in Materials Science Forum (24.05.2016)
Published in Materials Science Forum (24.05.2016)
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Journal Article
Characterization of Grapho-Silicidation on n+ 4H-SiC C-Face for Back Side Ohmic Contacts of Power Devices
De Silva, Milantha, Maeda, Tomonori, Ishikawa, Seiji, Sezaki, Hiroshi, Miyazaki, Takamichi, Kikkawa, Takamaro, Kuroki, Shin-Ichiro
Published in ECS journal of solid state science and technology (01.01.2016)
Published in ECS journal of solid state science and technology (01.01.2016)
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Journal Article
Quantitative evaluation for intravascular structures of vertebral artery dissection with a novel zoomed high-resolution black-blood MR imaging
Minakuchi, Kiyomi, Fukuda, Hitoshi, Miyake, Hirohisa, Maeda, Tomonori, Fukui, Naoki, Moriki, Akihito, Morimoto, Masanori, Ueba, Tetsuya
Published in The neuroradiology journal (01.10.2023)
Published in The neuroradiology journal (01.10.2023)
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Journal Article
Study of interface-trap and near-interface-state distribution in a 4H-SiC MOS capacitor with the full-distributed circuit model
Van Cuong, Vuong, Koyanagi, Kaho, Meguro, Tatsuya, Ishikawa, Seiji, Maeda, Tomonori, Sezaki, Hiroshi, Kuroki, Shin-Ichiro
Published in Japanese Journal of Applied Physics (01.01.2024)
Published in Japanese Journal of Applied Physics (01.01.2024)
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Journal Article
Which objective itch-assessment tools are applicable to patients with advanced cognitive impairments? A scoping review
Nitta, Shiori, Maeda, Tomonori, Koudounas, Sofoklis, Minematsu, Takeo, Tobe, Hiromi, Weller, Carolina, Sanada, Hiromi
Published in International journal of older people nursing (01.09.2022)
Published in International journal of older people nursing (01.09.2022)
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