Analysis of Backscattering Phenomenon from Drain Region in Silicon Decanano Diode
Tsutsumi, Toshiyuki, Tomizawa, Kazutaka
Published in Japanese Journal of Applied Physics (01.09.2006)
Published in Japanese Journal of Applied Physics (01.09.2006)
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Journal Article
Backscattered Electrons from a Drain Region in a Silicon Decanano Diode
Tsutsumi, Toshiyuki, Tomizawa, Kazutaka
Published in Japanese Journal of Applied Physics (01.09.2007)
Published in Japanese Journal of Applied Physics (01.09.2007)
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Journal Article
Submicron-Length Tungsten-Gate Self-Aligned GaAs FET
Matsumoto, Kazuhiko, Hashizume, Nobuo, Atoda, Nobuhumi, Nishimura, Kazuhiro, Tomizawa, Kazutaka, Kurosu, Tateki, Iida, Masamori
Published in Japanese Journal of Applied Physics (01.01.1982)
Published in Japanese Journal of Applied Physics (01.01.1982)
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Journal Article
Analysis of backscattering phenomenon from drain region in a silicon nanodiode
Tsutsumi, T., Tomizawa, K.
Published in Digest of Papers Microprocesses and Nanotechnology 2005 (2005)
Published in Digest of Papers Microprocesses and Nanotechnology 2005 (2005)
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