A method to study the electric field distribution on sample surfaces in atom probe analysis
Chen, Sunwei, Suzuki, Takumi, Tomiyasu, Bunbunoshin, Owari, Masanori
Published in Surface and interface analysis (01.08.2020)
Published in Surface and interface analysis (01.08.2020)
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Influence of the Shave-off Scan Speed on the Cross-Sectional Shape
Kang, So-Hee, Kim, Yun, Tomiyasu, Bunbunoshin, Owari, Masanori
Published in E-journal of surface science and nanotechnology (31.05.2018)
Published in E-journal of surface science and nanotechnology (31.05.2018)
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Emission Trajectory Calculation of Ions from the Shave-off Cross Section for Realization of 3D Shave-off Method
Takagi, Yuto, Kang, So-Hee, Matsumura, Kohei, Azuma, Takeki, Tomiyasu, Bunbunoshin, Owari, Masanori
Published in E-journal of surface science and nanotechnology (14.07.2018)
Published in E-journal of surface science and nanotechnology (14.07.2018)
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Study of Thickness Distributions of Sputtered Gold Particles Deposited on a Perpendicular Section for Enhancement of 3D MetA-SIMS
Akiba, Shouta, Yamazaki, Atsuko, Shirakura, Daichi, Tomiyasu, Bunbunoshin, Owari, Masanori
Published in E-journal of surface science and nanotechnology (01.01.2016)
Published in E-journal of surface science and nanotechnology (01.01.2016)
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Development of 3D MetA-SIMS for organic materials using Dual FIB ToF-SIMS
Yamazaki, Atsuko, Akiba, Shouta, Tomiyasu, Bunbunoshin, Owari, Masanori
Published in E-journal of surface science and nanotechnology (01.01.2015)
Published in E-journal of surface science and nanotechnology (01.01.2015)
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Angular Distribution of Secondary Ions under FIB-shave-off Condition -Toward Development of Three-Dimensional Secondary Ion Image System
Habib, Ahsan, Asakura, Hiroyuki, Fukushima, Miku, Kang, So-Hee, Kim, Yun, Tomiyasu, Bunbunoshin, Owari, Masanori
Published in Journal of Surface Analysis (2017)
Published in Journal of Surface Analysis (2017)
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Chen, Sunwei, Suzuki, Takumi, Tomiyasu, Bunbunoshin, Owari, Masanori
Published in Surface and interface analysis (01.08.2020)
Published in Surface and interface analysis (01.08.2020)
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Journal Article
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Chen, Sunwei, Suzuki, Takumi, Tomiyasu, Bunbunoshin, Owari, Masanori
Published in Surface and interface analysis (01.08.2020)
Published in Surface and interface analysis (01.08.2020)
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Journal Article
Cover Image
Chen, Sunwei, Suzuki, Takumi, Tomiyasu, Bunbunoshin, Owari, Masanori
Published in Surface and interface analysis (01.08.2020)
Published in Surface and interface analysis (01.08.2020)
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High spatial resolution 3D analysis of materials using gallium focused ion beam secondary ion mass spectrometry (FIB SIMS)
Tomiyasu, Bunbunoshin, Fukuju, Isamu, Komatsubara, Hirotaka, Owari, Masanori, Nihei, Yoshimasa
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.03.1998)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.03.1998)
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