Thermal Cycle Reliability of Copper Pillar Bumps in Advanced Fan-Out Packages
Shih, Meng-Kai, Chen, Shi-Jie, Lin, I. Hung, Lou, Bai-Yao, Ni, Tom
Published in Journal of electronic materials (02.10.2024)
Published in Journal of electronic materials (02.10.2024)
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Journal Article
Glass-Embedded Fan-Out Antenna-in-Packaging for 5G Millimeter Wave Applications
Liu, Chia-Hao, Lu, Ren-Kai, Chung, Hsien, Lwo, Ben-Je, Ni, Tom, Pan, Alice
Published in International Journal of Integrated Engineering (29.11.2022)
Published in International Journal of Integrated Engineering (29.11.2022)
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Journal Article
Active Ion-Trajectory Control at the Wafer Extreme Edge in Plasma Etch
Li, Guorong, Zhao, Kui, Yan, Lijun, Hiroshi, Iizuka, Liu, Shenjian, Tom, Ni, Zhang, Xing
Published in Beijing da xue xue bao (01.01.2019)
Published in Beijing da xue xue bao (01.01.2019)
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Journal Article
Extracting Radio Frequency Properties of a Typical Through-Silicon Via Structure With a Self-Developed Deembedding Technique
Tseng, Kun-Fu, Huang, Tzu-Yen, Lwo, Ben-Je, Ni, Tom
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.05.2019)
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.05.2019)
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Journal Article
Experimental Study of Capacitive RF c-C4F8 Discharge with Synchrotron Vacuum Ultraviolet Photoionization Mass Spectrometry
Zhou, Zhongyue, Xie, Mingfeng, Tang, Tang, Zhang, Yijun, Yuan, Tao, Qi, Fei, Ni, Tom, Qian, Xueyu
Published in Plasma chemistry and plasma processing (01.06.2010)
Published in Plasma chemistry and plasma processing (01.06.2010)
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Journal Article
Characteristics of Glass-Embedded FOAiP with Antenna Arrays for 60GHz mmWave Applications
Lin, I-Hung, Lin, Cheng-Chen, Pan, Ying-Chieh, Lwo, Ben-Je, Ni, Tom
Published in 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) (01.05.2022)
Published in 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) (01.05.2022)
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Conference Proceeding
Warpage Reduction on a Typical Fan-out Wafer Level Process by an Encircling Silicon Ring
Chung, Hsien, Li, Yu-Jyun, Lwo, Ben-Je, Ni, Tom
Published in 2021 16th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) (21.12.2021)
Published in 2021 16th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) (21.12.2021)
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Conference Proceeding
FOStrip Technique for Low-Cost Fan-Out Package
Lin, I-Hung, Chen, Yu-Tai, Huang, Ji-Ting, Lu, Hsiang-Hua, Pan, Ying-Chieh, Wang, Chien-Hui, Ni, Tom
Published in 2023 24th International Conference on Electronic Packaging Technology (ICEPT) (08.08.2023)
Published in 2023 24th International Conference on Electronic Packaging Technology (ICEPT) (08.08.2023)
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Conference Proceeding
Warpage Simulation on a Typical Fan-out Panel Level Package (FOPLP) Process with Glass Carrier
Lo, Wei-Chen, Lwo, Ben-Je, Chung, Hsien, Ni, Tom, Lu, Shirley
Published in 2019 14th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) (01.10.2019)
Published in 2019 14th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) (01.10.2019)
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Conference Proceeding
Impacts of inorganic fluoride on plasma etching process
Shenghua Zhu, Xingjian Chen, Ni, Tom, Xiaoming He
Published in 2016 China Semiconductor Technology International Conference (CSTIC) (01.03.2016)
Published in 2016 China Semiconductor Technology International Conference (CSTIC) (01.03.2016)
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Conference Proceeding
Challenge of 12″ CIS CSP development, explore via finite element method
Ni, Tom, Su, Scott, Cheng, Anna, Lu, Shirley, Su, Teddy, Chang, C. C., Fang, David, Tai, Johnson
Published in 2015 10th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) (01.10.2015)
Published in 2015 10th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) (01.10.2015)
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Conference Proceeding
Contact resistance of the micro bumps in a typical TSV structure
Ben-Je Lwo, Chia-Liang Teng, Ni, Tom, Lu, Shirley
Published in 2016 IEEE 37th International Electronics Manufacturing Technology (IEMT) & 18th Electronics Materials and Packaging (EMAP) Conference (01.09.2016)
Published in 2016 IEEE 37th International Electronics Manufacturing Technology (IEMT) & 18th Electronics Materials and Packaging (EMAP) Conference (01.09.2016)
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Conference Proceeding
Development of Chip-on-Wafer (CoW) stacked chip packaging for high-end CIS application
Ni, Tom, Lien, Lisa, Chen, Nuno, Huang, K. Y., Chang, Winson, Chung, K. W., Huang, Wesley, Wang, Roger, Chen, M. J., Liu, Alex, Hsu, S. C., Lin, James, Chang, C. C., Tai, Johnson
Published in 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) (01.05.2015)
Published in 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) (01.05.2015)
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Conference Proceeding
Method and apparatus for detecting planarization of metal films prior to clearing
Gopalan, Ramesh, Srivatsan, Sridharan, Ramanujam, Katgenhalli Y, Ni, Tom, Chiang, Conan
Year of Publication 06.04.2010
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Year of Publication 06.04.2010
Patent
Method and apparatus for detecting planarization of metal films prior to clearing
Gopalan, Ramesh, Srivatsan, Sridharan, Ramanujam, Katgenhalli Y, Ni, Tom, Chiang, Conan
Year of Publication 19.08.2008
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Year of Publication 19.08.2008
Patent
A plasma confinement apparatus
TOM NI, JINYUAN CHEN, ZHOU, XU-SHENG, FU, YUE-HONG, XU, CHAO-YANG, QING QIAN
Year of Publication 11.04.2009
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Year of Publication 11.04.2009
Patent