by Klots, A. R., Newaz, A. K. M., Wang, Bin, Prasai, D., Krzyzanowska, H., Lin, Junhao, Caudel, D., Ghimire, N. J., Yan, J., Ivanov, B. L., Velizhanin, K. A., Burger, A., Mandrus, D. G., Tolk, N. H., Pantelides, S. T., Bolotin, K. I.
Published in Scientific reports (16.10.2014)

by Liu, Zhiheng, Feldman, L. C., Tolk, N. H., Zhang, Zhenyu, Cohen, P. I.
Published in Science (American Association for the Advancement of Science) (19.05.2006)

by Spahr, E J, Wen, L, Stavola, M, Boatner, L A, Feldman, L C, Tolk, N H, Lüpke, G
Published in Physical review letters (21.05.2010)

by Spahr, E J, Wen, L, Stavola, M, Boatner, L A, Feldman, L C, Tolk, N H, Lüpke, G
Published in Physical review letters (20.02.2009)

by Sun, B, Shi, G A, Nageswara Rao, S V S, Stavola, M, Tolk, N H, Dixit, S K, Feldman, L C, Lüpke, G
Published in Physical review letters (27.01.2006)

by Vobornik, D., Margaritondo, G., Sanghera, J.S., Thielen, P., Aggarwal, I.D., Ivanov, B., Tolk, N.H., Manni, V., Grimaldi, S., Lisi, A., Rieti, S., Piston, D.W., Generosi, R., Luce, M., Perfetti, P., Cricenti, A.
Published in Journal of alloys and compounds (29.09.2005)

by Lawler, H M, Steigerwald, A, Gregory, J, Krzyzanowska, H, Tolk, N H
Published in Materials research express (01.06.2014)

by Lüpke, G, Zhang, X, Sun, B, Fraser, A, Tolk, N H, Feldman, L C
Published in Physical review letters (01.04.2002)

by Koldyaev, V., Kryger, M. C., Changala, J. P., Alles, M. L., Fleetwood, D. M., Schrimpf, R. D., Tolk, N.
Published in 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2015)

by Hari, P., Adair, J., Tolk, N., Sanghera, J., Aggarwal, I.
Published in Journal of non-crystalline solids (15.07.2006)

by Colonna, S., Ronci, F., Cricenti, A., Luches, P., Valeri, S., Qi, J., Xu, Y., Miller, J.K., Tolk, N.
Published in Surface science (15.09.2007)

by Budde, M, Lüpke, G, Chen, E, Zhang, X, Tolk, N H, Feldman, L C, Tarhan, E, Ramdas, A K, Stavola, M
Published in Physical review letters (01.10.2001)

by Sun, B, Yang, Q, Newman, R C, Pajot, B, Tolk, N H, Feldman, L C, Lüpke, G
Published in Physical review letters (07.05.2004)

by Tolk, N.H., Alles, M.L., Pasternak, R., Lu, X., Schrimpf, R.D., Fleetwood, D.M., Dolan, R.P., Standley, R.W.
Published in Microelectronic engineering (01.09.2007)

by Budde, M, Bech Nielsen B, Parks Cheney C, Tolk, N H, Feldman, L C
Published in Physical review letters (02.10.2000)

by Schneider, M. L, Demsar, J, Glinka, Y, Klimov, A, Krapf, A, Rast, S, Ren, Y. H, Si, Weidong, Xu, Y, Zeng, X. H, Bozovic, I, Lüpke, G, Manzke, R, Sobolewski, R, Taylor, A. T, Tolk, N. H, Xi, X. X, Joynt, R, Onellion, M
Published in Europhysics letters (01.11.2002)

by GENEROSI, J, MARGARITONDO, G, SANGHERA, J.S, AGGARWAL, I.D, TOLK, N.H, PISTON, D.W, CASTELLANO, A. CONGIU, CRICENTI, A
Published in Journal of microscopy (Oxford) (01.02.2008)

by CRICENTI, A, GENEROSI, R, LUCE, M, PERFETTI, P, SANGHERA, J.S, AGGARWAL, I.D, TOLK, N.H, VOBORNIK, D, MARGARITONDO, G, PISTON, D.W, MANNI, V, GRIMALDI, S, LISI, A, RIETI, S
Published in Journal of microscopy (Oxford) (01.03.2008)

by Alles, M.L., Pasternak, R., Xiong Lu, Tolk, N.H., Schrimpf, R.D., Fleetwood, D.M., Dolan, R.P., Standley, R.W.
Published in IEEE transactions on semiconductor manufacturing (01.05.2007)

by SCHNEIDER, M. L, RAST, S, XU, Y, SOBOLEWSKI, R, SI, W, ZENG, X. H, SOUKIASSIAN, A, XI, X. X, ABRECHT, M, ARIOSA, D, PAVUNA, D, KRAPF, A, ONELLION, M, MANZKE, R, PRINTZ, J. O, WILLIAMSEN, M. S, DOWNUM, K. E, GUPTASARMA, P, BOZOVIC, I, DEMSAR, J, TAYLOR, A. J, GLINKA, Y, TOLK, N. H, REN, Y. H, LÜPKE, G, KLIMOV, A
Published in The European physical journal. B, Condensed matter physics (01.12.2003)