by Toh, E.-H., Grace Huiqi Wang, Lap Chan, Samudra, G., Yee-Chia Yeo
Published in IEEE electron device letters (01.02.2008)

by Naik, V. B., Lim, J. H., Lee, T. Y., Neo, W. P., Dixit, H., K, S., Goh, L. C., Ling, T., Hwang, J., Zeng, D., Ting, J. W., Lee, K., Toh, E. H., Zhang, L., Low, R., Balasankaran, N., Zhang, L. Y., Gan, K. W., Hau, L. Y., Mueller, J., Pfefferling, B., Kallensee, O., Yamane, K., Tan, S. L., Seet, C. S., You, Y. S., Woo, S. T., Quek, E., Siah, S. Y., Pellerin, J., Chao, R., Kwon, J., Thiyagarajah, N., Chung, N. L., Jang, S. H., Behin-Aein, B.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)

by LIN, J, TOH, E. H, SHEN, C, SYLVESTER, D, HENG, C. H, SAMUDRA, G, YEO, Y. C
Published in Electronics letters (17.01.2008)

by Lee, T. Y., Yamane, K., Hau, L. Y., Chao, R., Chung, N. L., Naik, V. B., Sivabalan, K., Kwon, J., Lim, J. H., Neo, W. P., Khua, K., Thiyagarajah, N., Jang, S. H., Behin-Aein, B., Toh, E. H., Otani, Y., Zeng, D., Balasankaran, N., Goh, L. C., Ling, T., Hwang, J., Zhang, L., Low, R., Tan, S. L, Seet, C. S., Ting, J. W., Ong, S., You, Y. S., Woo, S. T., Quek, E., Siah, S. Y.
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)

by Naik, V. B., Yamane, K., Lee, T.Y., Kwon, J., Chao, R., Lim, J.H., Chung, N.L., Behin-Aein, B., Hau, L.Y., Zeng, D., Otani, Y., Chiang, C., Huang, Y., Pu, L., Jang, S.H., Neo, W.P., Dixit, H., Goh, S. K L. C., Toh, E. H., Ling, T., Hwang, J., Ting, J.W., Low, R., Zhang, L., Lee, C.G., Balasankaran, N., Tan, F., Gan, K. W., Yoon, H., Congedo, G., Mueller, J., Pfefferling, B., Kallensee, O., Vogel, A., Kriegerstein, V., Merbeth, T., Seet, C.S., Ong, S., Xu, J., Wong, J., You, Y.S., Woo, S.T., Chan, T.H., Quek, E., Siah, S. Y.
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)

by Goh, P M, Kum, C K, Toh, E H
Published in Surgical endoscopy (01.12.1994)

by Shen, C., Yang, L.T., Toh, E.-H., Heng, C.-H., Samudra, G.S., Yeo, Y.-C.
Published in 2009 International Symposium on VLSI Technology, Systems, and Applications (01.04.2009)

by Shen, C., Lin, J.-Q., Toh, E.-H., Chang, K.-F., Bai, P., Heng, C.-H., Samudra, G.S., Yeo, Y.-C.
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)

by House, J W, Toh, E H, Perez, A
Published in Otolaryngology-head and neck surgery (01.10.2001)

by Lee, K., Yamane, K., Noh, S., Naik, V. B., Yang, H., Jang, S. H., Kwon, J., Behin-Aein, B., Chao, R., Lim, J. H., S. K., Gan, K. W., Zeng, D., Thiyagarajah, N., Goh, L. C., Liu, B., Toh, E. H., Jung, B., Wee, T. L., Ling, T., Chan, T. H., Chung, N. L., Ting, J. W., Lakshmipathi, S., Son, J. S., Hwang, J., Zhang, L., Low, R., Krishnan, R., Kitamura, T., You, Y. S., Seet, C. S., Cong, H., Shum, D., Wong, J., Woo, S. T., Lam, J., Quek, E., See, A., Siah, S. Y.
Published in 2018 IEEE Symposium on VLSI Technology (01.06.2018)

by Lim, J. H., Raghavan, N., Mei, S., Naik, V. B., Kwon, J. H., Noh, S. M., Liu, B., Toh, E. H., Chung, N. L., Chao, R., Lee, K. H., Pey, K. L.
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)

by Naik, V. B., Yamane, K., Kwon, J., K, S., Lim, J. H., Ali, Z., Behin-Aein, B., Chung, N. L., Hau, L. Y., Chao, R., Chiang, C., Huang, Y., Pu, L., Otani, Y., Dixit, H., Jang, S. H., Balasankaran, N., Tan, F., Neo, W. P., Goh, L. C., Toh, E. H., Ling, T., Ting, J. W., Yoon, H., Congedo, G., Mueller, J., Pfefferling, B., Kallensee, O., Vogel, A., Merbeth, T., Seet, C. S., Wong, J., Bordelon, J., You, Y. S., Soss, S., Chan, T. H., Quek, E., Siah, S. Y.
Published in 2021 Symposium on VLSI Technology (13.06.2021)

by Lin, J, Toh, E H, Shen, C, Sylvester, D, Heng, C H, Samudra, G, Yeo, Y C
Published in Electronics letters (17.01.2008)

by Lee, K., Chao, R., Yamane, K., Naik, V. B., Yang, H., Kwon, J., Chung, N. L., Jang, S. H., Behin-Aein, B., Lim, J.H., K, S., Liu, B., Toh, E. H., Gan, K. W., Zeng, D., Thiyagarajah, N., Goh, L. C., Ling, T., Ting, J. W., Hwang, J., Zhang, L., Low, R., Krishnan, R., Zhang, L., Tan, S. L, You, Y. S., Seet, C. S., Cong, H., Wong, J., Woo, S. T., Quek, E., Siah, S. Y.
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)

by Brackmann, Derald E, Toh, Elizabeth H
Published in Otology & neurotology (01.07.2002)

by Nayak, Jayakar V, Teot, Lisa A, Vyas, Yatin, Snyderman, Carl H, Toh, Elizabeth H, Deleyiannis, Frederic W.-B
Published in International journal of pediatric otorhinolaryngology (01.05.2008)

by Toh, Elizabeth H, Luxford, William M
Published in Otolaryngologic clinics of North America (01.04.2002)

by Toh, Elizabeth H, De la Cruz, Antonio, Lo, William
Published in Otology & neurotology (01.01.2003)