Effect of Sample-Shape Imperfection on Uncertainty in Measurements of the Thermal-Conductivity by the Laser-Flash Method
Asach, A. V., Isachenko, G. N., Novotelnova, A. V., Fomin, V. E., Samusevich, K. L., Tkhorgevskii, I. L.
Published in Semiconductors (Woodbury, N.Y.) (01.06.2019)
Published in Semiconductors (Woodbury, N.Y.) (01.06.2019)
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Journal Article