Chip package interaction with Cu Pillar interconnects - systematic study of key factors impacting the qualification
Boehme, Bjoern, Breuer, Dirk, Goetze, Christian, Estoque, Al Rhea, Tischer, Falk, Kuechenmeister, Frank, Paul, Jens, Thiele, Michael
Published in 2017 IMAPS Nordic Conference on Microelectronics Packaging (NordPac) (01.06.2017)
Published in 2017 IMAPS Nordic Conference on Microelectronics Packaging (NordPac) (01.06.2017)
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