In‐Memory Hamming Weight Calculation in a 1T1R Memristive Array
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Published in Advanced electronic materials (01.09.2020)
Published in Advanced electronic materials (01.09.2020)
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Physical and chemical mechanisms in oxide-based resistance random access memory
Chang, Kuan-Chang, Chang, Ting-Chang, Tsai, Tsung-Ming, Zhang, Rui, Hung, Ya-Chi, Syu, Yong-En, Chang, Yao-Feng, Chen, Min-Chen, Chu, Tian-Jian, Chen, Hsin-Lu, Pan, Chih-Hung, Shih, Chih-Cheng, Zheng, Jin-Cheng, Sze, Simon M
Published in Nanoscale research letters (12.03.2015)
Published in Nanoscale research letters (12.03.2015)
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Abnormal Hump and Two-Step Degradation of Top Gate a-InGaZnO TFTs Under Positive Bias Stress
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Published in IEEE transactions on electron devices (01.08.2022)
Published in IEEE transactions on electron devices (01.08.2022)
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Investigation Between Recover Behavior and Defect With Variation of Light Source in AlGaN/GaN HEMTs After Hot-Carrier Stress
Sun, Li-Chuan, Lin, Shih-Kai, Yeh, Yu-Hsuan, Tu, Yu-Fa, Tan, Yung-Fang, Zhou, Kuan-Ju, Tsai, Tsung-Ming, Chang, Ting-Chang
Published in IEEE electron device letters (01.04.2023)
Published in IEEE electron device letters (01.04.2023)
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Improving Hot Carrier Reliability of Organic-TFTs by Extended Electrode
Hung, Wei-Chun, Lin, Jia-Hong, Chang, Ting-Chang, Zheng, Yu-Zhe, Hung, Yang-Hao, Chen, Yu-An, Wang, Li-Wen, Tsai, Chia-Hung, Ogier, Simon
Published in IEEE electron device letters (01.04.2023)
Published in IEEE electron device letters (01.04.2023)
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Enhancing Reliability of Short-Channel Dual Gate InGaZnO Thin Film Transistors by Bottom-Gate Oxide Engineering
Zhou, Kuan-Ju, Chang, Ting-Chang, Yen, Po-Yu, Chen, Yu-An, Chien, Ya-Ting, Huang, Bo-Shen, Lee, Po-Yi, Juan, Tzu-Hsuan, Sze, Simon M., Fan, Yang-Shun, Huang, Chen-Shuo, Tsai, Chih-Hung
Published in IEEE electron device letters (01.04.2024)
Published in IEEE electron device letters (01.04.2024)
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Planar Heterojunction Perovskite Solar Cells Incorporating Metal-Organic Framework Nanocrystals
Chang, Ting-Hsiang, Kung, Chung-Wei, Chen, Hsin-Wei, Huang, Tzu-Yen, Kao, Sheng-Yuan, Lu, Hsin-Che, Lee, Min-Han, Boopathi, Karunakara Moorthy, Chu, Chih-Wei, Ho, Kuo-Chuan
Published in Advanced materials (Weinheim) (25.11.2015)
Published in Advanced materials (Weinheim) (25.11.2015)
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Abnormal On-Current Degradation Under Non-Conductive Stress in Contact Field Plate Lateral Double-Diffused Metal-Oxide- Semiconductor Transistor With 0.13-μm Bipolar-CMOS-DMOS Technology
Hung, Wei-Chun, Tu, Yu-Fa, Chang, Ting-Chang, Tai, Mao-Chou, Tan, Yung-Fang, Chen, Kuan-Hsu, Yeh, Chien-Hung, Tu, Hong-Yi, Kuo, Hung-Ming
Published in IEEE electron device letters (01.05.2022)
Published in IEEE electron device letters (01.05.2022)
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Abnormal On Current Tendency in Saturation Region between High and Light Carbon Doped buffer layer in p-GaN HEMT
Yeh, Chien-Hung, Chen, Po-Hsun, Chang, Ting-Chang, Chang, Kai-Chun, Wang, Yu-Xuan, Kuo, Ting-Tzu, Zhang, Yong-Ci, Lin, Jia-Hong, Lee, Ya-Huan, Kuo, Hung-Ming, Yen, Wei-Ting, Tsai, I-Ting, Sze, Simon M.
Published in IEEE electron device letters (01.07.2023)
Published in IEEE electron device letters (01.07.2023)
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Reconfigurable logic in nanosecond Cu/GeTe/TiN filamentary memristors for energy-efficient in-memory computing
Jin, Miao-Miao, Cheng, Long, Li, Yi, Hu, Si-Yu, Lu, Ke, Chen, Jia, Duan, Nian, Wang, Zhuo-Rui, Zhou, Ya-Xiong, Chang, Ting-Chang, Miao, Xiang-Shui
Published in Nanotechnology (21.09.2018)
Published in Nanotechnology (21.09.2018)
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Degradation Behavior of Etch-Stopper-Layer Structured a-InGaZnO Thin-Film Transistors Under Hot-Carrier Stress and Illumination
Lin, Dong, Su, Wan-Ching, Chang, Ting-Chang, Chen, Hong-Chih, Tu, Yu-Fa, Zhou, Kuan-Ju, Hung, Yang-Hao, Yang, Jianwen, Lu, I-Nien, Tsai, Tsung-Ming, Zhang, Qun
Published in IEEE transactions on electron devices (01.02.2021)
Published in IEEE transactions on electron devices (01.02.2021)
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DNA methylation marker for the triage of hrHPV positive women in cervical cancer screening: Real-world evidence in Taiwan
Chang, Chih-Long, Ho, Shih-Chu, Su, Yee-Fun, Juan, Yi-Chen, Huang, Chueh-Yi, Chao, An-Shine, Hsu, Zen-Shing, Chang, Chi-Feng, Fwu, Chyng-Wen, Chang, Ting-Chang
Published in Gynecologic oncology (01.05.2021)
Published in Gynecologic oncology (01.05.2021)
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Stably Saturated Output Current Characteristics and Hot-Carrier Reliability of a-InGaZnO Thin-Film Transistors With Source-Connected Field Plate
Tu, Yu-Fa, Huang, Jen-Wei, Chang, Ting-Chang, Hung, Yang-Hao, Tai, Mao-Chou, Chen, Jian-Jie, Lin, Shih-Kai, Zhou, Kuan-Ju, Chien, Ya-Ting, Huang, Hui-Chun, Lien, Chen-Hsin
Published in IEEE transactions on electron devices (01.09.2023)
Published in IEEE transactions on electron devices (01.09.2023)
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