by Capellini, G, Reich, C, Guha, S, Yamamoto, Y, Lisker, M, Virgilio, M, Ghrib, A, El Kurdi, M, Boucaud, P, Tillack, B, Schroeder, T
Published in Optics express (13.01.2014)

by Gajda, Andrzej, Zimmermann, Lars, Bruns, J, Tillack, B, Petermann, K
Published in Optics express (09.05.2011)

by Hossain, Maruf, Kraemer, T., Ostermay, I., Jensen, T., Janke, B., Borokhovych, Y., Lisker, M., Glisic, S., Elkhouly, M., Borngraeber, J., Tillack, B., Meliani, C., Krueger, O., Krozer, V., Heinrich, W.
Published in IEEE microwave and wireless components letters (01.07.2014)

by Heinemann, B, Barth, R, Knoll, D, Rücker, H, Tillack, B, Winkler, W
Published in Semiconductor science and technology (01.01.2007)

by Yoon, D, Seo, M.-G, Song, K, Kaynak, M, Tillack, B, Rieh, J.-S
Published in Electronics letters (02.02.2017)

by WALCZYK, D, WALCZYK, Ch, SCHROEDER, T, BERTAUD, T, SOWINSKA, M, LUKOSIUS, M, FRASCHKE, M, TILLACK, B, WENGER, Ch
Published in Microelectronic engineering (01.07.2011)

by Zaumseil, P, Kozlowski, G, Schubert, M A, Yamamoto, Y, Bauer, J, Schülli, T U, Tillack, B, Schroeder, T
Published in Nanotechnology (07.09.2012)

by ULUSOY, A. C, KAYNAK, M, PURTOVA, T, TILLACK, B, SCHUMACHER, H
Published in Electronics letters (06.12.2012)

by Kozlowski, G, Zaumseil, P, Schubert, M A, Yamamoto, Y, Bauer, J, Schülli, T U, Tillack, B, Schroeder, T
Published in Nanotechnology (23.03.2012)

by Giuntoni, I., Stolarek, D., Richter, H., Marschmeyer, S., Bauer, J., Gajda, A., Bruns, J., Tillack, B., Petermann, K., Zimmermann, L.
Published in IEEE photonics technology letters (15.12.2009)

by Tillack, B.
Published in Thin solid films (15.04.1998)

by Ostermay, I., Thies, A., Kraemer, T., John, W., Weimann, N., Schmückle, F.-J., Sinha, S., Krozer, V., Heinrich, W., Lisker, M., Tillack, B., Krüger, O.
Published in Microelectronic engineering (01.08.2014)

by Yamamoto, Y., Zaumseil, P., Murota, J., Tillack, B.
Published in ECS journal of solid state science and technology (01.01.2014)

by Liu, C.W., Cheng, T.-H., Chen, Y.-Y., Jan, S.-R., Chen, C.-Y., Chan, S.T., Nien, Y.-H., Yamamoto, Y., Tillack, B.
Published in Thin solid films (01.02.2012)

by BARISTIRAN KAYNAK, C, LUKOSIUS, M, TILLACK, B, WENGER, Ch, BLOMBERG, T, RUHL, G
Published in Microelectronic engineering (01.07.2011)

by BARISTIRAN KAYNAK, C, LUKOSIUS, M, COSTINA, I, TILLACK, B, WENGER, Ch, RUHL, G, BLOMBERG, T
Published in Thin solid films (30.06.2011)

by Bauer, J., Yamamoto, Y., Zaumseil, P., Fursenko, O., Schulz, K., Kozlowski, G., Schubert, M.A., Schroeder, T., Tillack, B.
Published in Microelectronic engineering (01.09.2012)

by Heinemann, B., Rücker, H., Tillack, B.
Published in Thin solid films (03.11.2008)

by Torres Matabosch, N., Coccetti, F., Kaynak, M., Espana, B., Tillack, B., Cazaux, J.L.
Published in Microelectronics and reliability (01.09.2013)

by Fursenko, O., Bauer, J., Zaumseil, P., Yamamoto, Y., Tillack, B.
Published in Thin solid films (03.11.2008)