by Jenihhin, Maksim, Squillero, Giovanni, Copetti, Thiago Santos, Tihhomirov, Valentin, Kostin, Sergei, Gaudesi, Marco, Vargas, Fabian, Raik, Jaan, Sonza Reorda, Matteo, Bolzani Poehls, Leticia, Ubar, Raimund, Medeiros, Guilherme Cardoso
Published in Journal of electronic testing (01.06.2016)

by Pellerey, Francesco, Jenihhin, Maksim, Squillero, Giovanni, Raik, Jaan, Reorda, Matteo Sonza, Tihhomirov, Valentin, Ubar, Raimund
Published in 2016 IEEE 25th Asian Test Symposium (ATS) (01.11.2016)

by Gaudesi, Marco, Jenihhin, Maksim, Raik, Jaan, Sanchez, Ernesto, Squillero, Giovanni, Tihhomirov, Valentin, Ubar, Raimund
Published in Applications of Evolutionary Computation (2014)

by Tihhomirov, Valentin, Tsepurov, Anton, Jenihhin, Maksim, Raik, Jaan, Ubar, Raimund
Published in 2013 14th Latin American Test Workshop - LATW (01.04.2013)

by Jenihhin, Maksim, Baranov, Samary, Raik, Jaan, Tihhomirov, Valentin
Published in 2012 13th Latin American Test Workshop (LATW) (01.04.2012)

by Tsepurov, Anton, Bartsch, Gunter, Dorsch, Rainer, Jenihhin, Maksim, Raik, Jaan, Tihhomirov, Valentin
Published in 2012 IEEE/IFIP 20th International Conference on VLSI and System-On-Chip (01.10.2012)

by Tepurov, Anton, Tihhomirov, Valentin, Jenihhin, Maksim, Raik, Jaan, Bartsch, Gunter, Escobar, Jorge Hernan Meza, Wuttke, Heinz-Dietrich
Published in 2012 13th International Workshop on Microprocessor Test and Verification (MTV) (01.12.2012)

by Raik, J., Ellervee, P., Tihhomirov, V., Ubar, R.
Published in 8th Euromicro Conference on Digital System Design (DSD'05) (2005)

by Ellervee, P., Raik, J., Tihhomirov, V., Ubar, R.
Published in Proceedings Norchip Conference, 2004 (2004)

by Jenihhin, Maksim, Tsepurov, Anton, Tihhomirov, Valentin, Raik, Jaan, Hantson, Hanno, Ubar, Raimund, Bartsch, Gunter, Escobar, JorgeHernan Meza, Wuttke, Heinz-Dietrich
Published in IEEE design and test (01.02.2014)