Strain coupling optimization in magnetoelectric transducers
Tierno, D., Ciubotaru, F., Duflou, R., Heyns, M., Radu, I.P., Adelmann, C.
Published in Microelectronic engineering (05.02.2018)
Published in Microelectronic engineering (05.02.2018)
Get full text
Journal Article
Reliability of Mo as Word Line Metal in 3D NAND
Tierno, D., Croes, K., Ajaykumar, A., Ramesh, S., Van den Bosch, G., Rosmeulen, M.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Get full text
Conference Proceeding
Dielectric Reliability Study of 21 nm Pitch Interconnects with Barrierless Ru Fill
Lesniewska, A., Roussel, P.J., Tierno, D., Gonzalez, V. Vega, van der Veen, M. H., Verdonck, P., Jourdan, N., Wilson, C.J., Tokei, Zs, Croes, K.
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Get full text
Conference Proceeding
Experimental Study Of Interface & Bulk Defectivity In Ultra-Thin BEOL Dielectrics By Using Low Frequency Noise Spectroscopy
Saini, N., Tierno, D., Croes, K., Afanas'ev, V.
Published in 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) (01.05.2023)
Published in 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) (01.05.2023)
Get full text
Conference Proceeding
Pure-Metal Replacement Gate for Reliable 30 nm Pitch Scaled 3D NAND Flash
Rachidi, S., Ramesh, S., Tierno, D., Donadio, G. L., Pacco, A., Maes, J. W., Jeong, Y., Arreghini, A., Van Den Bosch, G., Rosmeulen, M.
Published in 2024 IEEE International Memory Workshop (IMW) (12.05.2024)
Published in 2024 IEEE International Memory Workshop (IMW) (12.05.2024)
Get full text
Conference Proceeding
A new methodology for modeling Air-Gap TDDB
Fang, Yu, Ciofi, I., Roussel, Ph, Lesniewska, A., Degraeve, R., Tierno, D., De Wolf, I., Croes, K.
Published in 2022 IEEE International Interconnect Technology Conference (IITC) (27.06.2022)
Published in 2022 IEEE International Interconnect Technology Conference (IITC) (27.06.2022)
Get full text
Conference Proceeding
Selective ALD Mo Deposition in 10nm Contacts
van der Veen, Marleen H., Maes, J. W., Pedreira, O. Varela, Zhu, C., Tierno, D., Datta, S., Jourdan, N., Decoster, S., Wu, C., Mousa, M., Byun, Y., Struyf, H., Park, S., Tokei, Z.
Published in 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) (01.05.2023)
Published in 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) (01.05.2023)
Get full text
Conference Proceeding
Semi-damascene Integration of a 2-layer MOL VHV Scaling Booster to Enable 4-track Standard Cells
Vega-Gonzalez, V., Radisic, D., Choudhury, S., Tierno, D., Thiam, A., Batuk, D., Martinez, G.T., Seidel, F., Decoster, S., Kundu, S., Tsvetanova, D., Peter, A., De Coster, H., Sepulveda-Marquez, A., Altamirano-Sanchez, E., Chan, Bt, Drissi, Y., Sherazi, Y., Uk-Lee, J., Ciofi, I., Murdoch, G., Nagesh, N., Hellings, G., Ryckaert, J., Biesemans, S., Litta, E. Dentoni, Horiguchi, N., Park, S., Tokei, Zs
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
Get full text
Conference Proceeding
Cobalt and Ruthenium drift in ultra-thin oxides
Tierno, D., Varela Pedreira, O., Wu, C., Jourdan, N., Kljucar, L., Tőkei, Zs, Croes, K.
Published in Microelectronics and reliability (01.09.2019)
Published in Microelectronics and reliability (01.09.2019)
Get full text
Journal Article
Mitigating Line-Break Defectivity with a Sandwiched TiN or W Layer for Metal Pitch 18 NM Aspect Ratio 6 Semi-Damascene Interconnects
Gupta, A., Kundu, S., Decoster, S., Sah, K., Delie, G., Truijen, B., Tierno, D., Marti, G., Pedreira, O. Varela, Kenens, B., Hermans, Y., Adelmann, C., de Wachter, B., Ciofi, I., Murdoch, G., Cross, A., Park, S., Tokei, Z.
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Get full text
Conference Proceeding
Exploring the Reliability Limits for the Z-Pitch Scaling of Molybdenum Inter-Word Line Oxides in 3D NAND
Tiernc, D., Arreghini, A., Lesniewska, A., Jeong, Y., van der Veen, M. H., Stiers, J., Bazzazian, N., Ciofi, I., Van den Bosch, G., Rosmeulen, M.
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Get full text
Conference Proceeding
What do molecular data and vibrational communication tell us about the taxonomy of the genus Tyrrhenoleuctra Consiglio, 1957 (Plecoptera: Leuctridae) in Spain?
Luzón-Ortega, Julio Miguel, Vannucchi, Patrizia Elena, Rodríguez, Manuel Jesús López, Fochetti, Romolo, Figueroa, José Manuel Tierno DE
Published in Zootaxa (11.07.2023)
Published in Zootaxa (11.07.2023)
Get more information
Journal Article
BPZT HBARs for bias-tunable, stress generation at GHz frequencies
Bhaskar, U K, Tierno, D, Talmelli, G, Ciubotaru, F, Adelmann, C, Devolder, T
Published in arXiv.org (03.06.2021)
Published in arXiv.org (03.06.2021)
Get full text
Paper
Journal Article
Freshwater biodiversity in the rivers of the Mediterranean Basin: Streams in mediterranean climate regions: lessons learned from the last decade
TIERNO DE FIGUEROA, J. Manuel, LOPEZ-RODRIGUEZ, Manuel J, FENOGLIO, Stefano, SANCHEZ-CASTILLO, Pedro, FOCHETTI, Romolo
Published in Hydrobiologia (2013)
Get full text
Published in Hydrobiologia (2013)
Journal Article