Noise modeling for RF CMOS circuit simulation
Scholten, A.J., Tiemeijer, L.F., van Langevelde, R., Havens, R.J., Zegers-van Duijnhoven, A.T.A., Venezia, V.C.
Published in IEEE transactions on electron devices (01.03.2003)
Published in IEEE transactions on electron devices (01.03.2003)
Get full text
Journal Article
Comparison of the "pad-open-short" and "open-short-load" deembedding techniques for accurate on-wafer RF characterization of high-quality passives
Tiemeijer, L.F., Havens, R.J., Jansman, A.B.M., Bouttement, Y.
Published in IEEE transactions on microwave theory and techniques (01.02.2005)
Published in IEEE transactions on microwave theory and techniques (01.02.2005)
Get full text
Journal Article
RF-CMOS performance trends
Woerlee, P.H., Knitel, M.J., van Langevelde, R., Klaassen, D.B.M., Tiemeijer, L.F., Scholten, A.J., Zegers-van Duijnhoven, A.T.A.
Published in IEEE transactions on electron devices (01.08.2001)
Published in IEEE transactions on electron devices (01.08.2001)
Get full text
Journal Article
Improved Y-factor method for wide-band on-wafer noise-parameter measurements
Tiemeijer, L.F., Havens, R.J., de Kort, R., Scholten, A.J.
Published in IEEE transactions on microwave theory and techniques (01.09.2005)
Published in IEEE transactions on microwave theory and techniques (01.09.2005)
Get full text
Journal Article
The New CMC Standard Compact MOS Model PSP: Advantages for RF Applications
Scholten, A.J., Smit, G.D.J., De Vries, B.A., Tiemeijer, L.F., Croon, J.A., Klaassen, D.B.M., van Langevelde, R., Xin Li, Weimin Wu, Gildenblat, G.
Published in IEEE journal of solid-state circuits (01.05.2009)
Published in IEEE journal of solid-state circuits (01.05.2009)
Get full text
Journal Article
Conference Proceeding
RF capacitance-voltage characterization of MOSFETs with high leakage dielectrics
Schmitz, J., Cubaynes, F.N., Havens, R.J., de Kort, R., Scholten, A.J., Tiemeijer, L.F.
Published in IEEE electron device letters (01.01.2003)
Published in IEEE electron device letters (01.01.2003)
Get full text
Journal Article
Systematic Lumped-Element Modeling of Differential IC Transmission Lines
Tiemeijer, L.F., Pijper, R.M.T., van Steenwijk, J.A., van Noort, W.
Published in IEEE transactions on microwave theory and techniques (01.06.2009)
Published in IEEE transactions on microwave theory and techniques (01.06.2009)
Get full text
Journal Article
Numerical modeling of RF noise in scaled MOS devices
Jungemann, C., Neinhüs, B., Nguyen, C.D., Scholten, A.J., Tiemeijer, L.F., Meinerzhagen, B.
Published in Solid-state electronics (2006)
Published in Solid-state electronics (2006)
Get full text
Journal Article
Conference Proceeding
The impact of an aluminum top layer on inductors integrated in an advanced CMOS copper backend
Tiemeijer, L.F., Havens, R.J., Bouttement, Y., Pranger, H.J.
Published in IEEE electron device letters (01.11.2004)
Published in IEEE electron device letters (01.11.2004)
Get full text
Journal Article
Test structure design considerations for RF-CV measurements on leaky dielectrics
Schmitz, J., Cubaynes, F.N., Havens, R.J., de Kort, R., Scholten, A.J., Tiemeijer, L.F.
Published in IEEE transactions on semiconductor manufacturing (01.05.2004)
Published in IEEE transactions on semiconductor manufacturing (01.05.2004)
Get full text
Journal Article
Conference Proceeding
X-Parameters Based Characterization and Compact Modeling of SiGe HBT Linearity
Niu, G., Zhang, Anni, Li, Yiao, Zhang, Huaiyuan, Scholten, Andries, Willemsen, Marnix, Pijper, Ralf, Tiemeijer, L.F.
Published in ECS transactions (08.09.2020)
Published in ECS transactions (08.09.2020)
Get full text
Journal Article
Passive FM locking in InGaAsP semiconductor lasers
Tiemeijer, L.F., Kuindersma, P.I., Thijs, P.J.A., Rikken, G.L.J.
Published in IEEE journal of quantum electronics (01.06.1989)
Published in IEEE journal of quantum electronics (01.06.1989)
Get full text
Journal Article