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"Thijssen, Rutger M.T."
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Mapping buried nanostructures using subsurface ultrasonic resonance force microscopy
by
van Es, Maarten H.
,
Mohtashami, Abbas
,
Thijssen
,
Rutger M.T
.
,
Piras, Daniele
,
van Neer, Paul L.M.J.
,
Sadeghian, Hamed
Published in
Ultramicroscopy
(01.01.2018)
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On the resolution of subsurface atomic force microscopy and its implications for subsurface feature sizing
by
Piras, Daniele
,
van Neer, Paul L M J
,
Thijssen, Rutger M T
,
Sadeghian, Hamed
Published in
Review of scientific instruments
(01.08.2020)
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