Influence of AC signal oscillator level on effective mobility measurement by split C–V technique in MOSFETs
Karatsori, T.A, Theodorou, C.G, Dimitriadis, C.A, Ghibaudo, G
Published in Electronics letters (18.08.2016)
Published in Electronics letters (18.08.2016)
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Journal Article
Impact of low-frequency noise variability on statistical parameter extraction in ultra-scaled CMOS devices
Ioannidis, E.G, Theodorou, C.G, Haendler, S, Dimitriadis, C.A, Ghibaudo, G
Published in Electronics letters (11.09.2014)
Published in Electronics letters (11.09.2014)
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Journal Article
Threshold voltage of p-type triple-gate junctionless transistors
Oproglidis, T.A., Tassis, D.H., Tsormpatzoglou, A., Karatsori, T.A., Theodorou, C.G., Barraud, S., Ghibaudo, G., Dimitriadis, C.A.
Published in Solid-state electronics (01.11.2022)
Published in Solid-state electronics (01.11.2022)
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Journal Article
Static and low frequency noise characterization of ultra-thin body InAs MOSFETs
Karatsori, T.A., Pastorek, M., Theodorou, C.G., Fadjie, A., Wichmann, N., Desplanque, L., Wallart, X., Bollaert, S., Dimitriadis, C.A., Ghibaudo, G.
Published in Solid-state electronics (01.05.2018)
Published in Solid-state electronics (01.05.2018)
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Journal Article
Origin of the low-frequency noise in n-channel FinFETs
Theodorou, C.G., Fasarakis, N., Hoffman, T., Chiarella, T., Ghibaudo, G., Dimitriadis, C.A.
Published in Solid-state electronics (01.04.2013)
Published in Solid-state electronics (01.04.2013)
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Journal Article
Symmetrical unified compact model of short-channel double-gate MOSFETs
Papathanasiou, K., Theodorou, C.G., Tsormpatzoglou, A., Tassis, D.H., Dimitriadis, C.A., Bucher, M., Ghibaudo, G.
Published in Solid-state electronics (01.03.2012)
Published in Solid-state electronics (01.03.2012)
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Journal Article
Static and low frequency noise characterization of ultra-thin body InAs MOSFETs
Karatsori, T. A., Pastorek, M., Theodorou, C. G., Fadjie, A., Wichmann, N., Desplanque, L., Wallart, X., Bollaert, S., Dimitriadis, C. A., Ghibaudo, G.
Published in 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (01.04.2017)
Published in 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (01.04.2017)
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Conference Proceeding