Assembly of phosphonic acids on GaN and AlGaN
Simpkins, B S, Hong, S, Stine, R, Mäkinen, A J, Theodore, N D, Mastro, M A, Eddy, C R, Pehrsson, P E
Published in Journal of physics. D, Applied physics (13.01.2010)
Published in Journal of physics. D, Applied physics (13.01.2010)
Get full text
Journal Article
Irradiation of amorphous Ta42Si13N45 film with a femtosecond laser pulse
Romano, V., Meier, M., Theodore, N. D., Marble, D. K., Nicolet, M.-A.
Published in Applied physics. A, Materials science & processing (01.07.2011)
Published in Applied physics. A, Materials science & processing (01.07.2011)
Get full text
Journal Article
Dopant Activation in Arsenic-Implanted Si by Susceptor-Assisted Low-Temperature Microwave Anneal
Vemuri, R. N. P., Gadre, M. J., Theodore, N. D., Alford, T. L.
Published in IEEE electron device letters (01.08.2011)
Published in IEEE electron device letters (01.08.2011)
Get full text
Journal Article
The effect of sputtering pressure on electrical, optical and structure properties of indium tin oxide on glass
Elhalawaty, S., Sivaramakrishnan, K., Theodore, N.D., Alford, T.L.
Published in Thin solid films (02.04.2010)
Published in Thin solid films (02.04.2010)
Get full text
Journal Article
Formation and characterization of silicon films on flexible polymer substrates
Shetty, P.K., Theodore, N.D., Ren, J., Menendez, J., Kim, H.C., Misra, E., Mayer, J.W., Alford, T.L.
Published in Materials letters (01.04.2005)
Published in Materials letters (01.04.2005)
Get full text
Journal Article
Nanocrystalline Si formation in the a-Si/Al system on polyimide and silicon dioxide substrates
Alford, T.L., Shetty, P.K., Theodore, N.D., Tile, N., Adams, D., Mayer, J.W.
Published in Thin solid films (30.04.2008)
Published in Thin solid films (30.04.2008)
Get full text
Journal Article
Failure mechanisms of pure silver, pure aluminum and silver–aluminum alloy under high current stress
Misra, E., Theodore, N.D., Mayer, J.W., Alford, T.L.
Published in Microelectronics and reliability (01.12.2006)
Published in Microelectronics and reliability (01.12.2006)
Get full text
Journal Article
Improving electromigration reliability in Al-alloy lines
Rajagopalan, G., Dreyer, M.L., Theodore, N.D., Cale, T.S.
Published in Thin solid films (01.12.1995)
Published in Thin solid films (01.12.1995)
Get full text
Journal Article
Conference Proceeding
Segregation of Cu in Cu(Ti) alloys during nitridation in NH3
Get full text
Conference Proceeding
Journal Article
Influence of interfacial copper during the dealloying and nitridation of Cu-Ti films
Alford, T.L., Adams, Daniel, Theodore, N.D., Laursen, T., Kim, M.J.
Published in Materials chemistry and physics (01.11.1996)
Published in Materials chemistry and physics (01.11.1996)
Get full text
Journal Article
Spontaneous oxide reduction in metal stacks
Qin, Wentao, Volinsky, Alex A., Werho, Dennis, Theodore, N. David, Kottke, Mike, Ramiah, Chandra
Published in Thin solid films (14.02.2005)
Published in Thin solid films (14.02.2005)
Get full text
Journal Article