Validation vector grade (VVG): a new coverage metric for validation and test
Thaker, P.A., Agrawal, V.D., Zaghloul, M.E.
Published in Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) (1999)
Published in Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) (1999)
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