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Dynamic Statistical-Timing-Analysis-Based VLSI Path Delay Test Pattern Generation
Liu, Bao, Wang, Lu
Published in IEEE transactions on very large scale integration (VLSI) systems (01.09.2015)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.09.2015)
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Journal Article
Scalable Compact Test Pattern Generation for Path Delay Faults Based on Functions
Flanigan, E., Tragoudas, S., Abdulrahman, A.
Published in 2009 27th IEEE VLSI Test Symposium (01.05.2009)
Published in 2009 27th IEEE VLSI Test Symposium (01.05.2009)
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Conference Proceeding
Implementing enhanced diagnostics with intelligent pattern combination in automatic test pattern generation (ATPG)
Year of Publication 06.08.2019
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Patent
Recursive Pseudo-Exhaustive Two-Pattern Generation
Voyiatzis, I., Gizopoulos, D., Paschalis, A.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.01.2010)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.01.2010)
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Journal Article
Automatic test pattern generation (ATPG) considering crosstalk effects
Year of Publication 22.12.2015
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Patent
AUTOMATIC TEST PATTERN GENERATION (ATPG) CONSIDERING CROSSTALK EFFECTS
Year of Publication 10.01.2014
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Patent
Effective and Efficient Test and Diagnosis Pattern Generation for Many Inter-Die Interconnects in Chiplet-Based Packages
Chuang, Po-Yao, Lorenzelli, Francesco, Chakravarty, Sreejit, Boutobza, Slimane, Wu, Cheng-Wen, Gielen, Georges, Marinissen, Erik Jan
Published in IEEE International 3D Systems Integration Conference (10.05.2023)
Published in IEEE International 3D Systems Integration Conference (10.05.2023)
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Conference Proceeding
IMPLEMENTING ENHANCED DIAGNOSTICS WITH INTELLIGENT PATTERN COMBINATION IN AUTOMATIC TEST PATTERN GENERATION (ATPG)
Year of Publication 20.03.2017
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Patent
SPFD: A new method to express functional flexibility
Yamashita, S., Sawada, H., Nagoya, A.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.2000)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.2000)
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Journal Article
Test Architecture for Fine Grained Capture Power Reduction
Sun, Yi, Jiang, Hui, Ramakrishnan, Lakshmi, Segal, Matan, Nepal, Kundan, Dworak, Jennifer, Manikas, Theodore, Bahar, R. Iris
Published in 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (01.11.2019)
Published in 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (01.11.2019)
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Conference Proceeding
Realization-independent ATPG for designs with unimplemented blocks
Hyungwon Kim, Hayes, J.P.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.02.2001)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.02.2001)
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Journal Article