Search Results - "Terlier, T" :: K.UTB vyhledávací portál

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Improvement of the Correlative AFM and ToF-SIMS Approach Using an Empirical Sputter Model for 3D Chemical Characterization

by Terlier, T, Lee, J, Lee, K, Lee, Y
Published in Analytical chemistry (Washington) (06.02.2018)

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ToF-SIMS Depth Profiling of PS-b-PMMA Block Copolymers Using Ar n + , C 60 ++ , and Cs + Sputtering Ions

by Terlier, T, Zappalà, G, Marie, C, Leonard, D, Barnes, J-P, Licciardello, A
Published in Analytical chemistry (Washington) (05.07.2017)

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ToF-SIMS Depth Profiling of PS-b-PMMA Block Copolymers Using Arn+, C60++, and Cs+ Sputtering Ions

by Terlier, T, Zappal, G, Marie, C, Leonard, D, Barnes, J-P, Licciardello, A
Published in Analytical chemistry (Washington) (05.07.2017)

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Investigation of block depth distribution in PS-b-PMMA block copolymer using ultra-low-energy cesium sputtering in ToF-SIMS

by Terlier, T., Tiron, R., Gharbi, A., Chevalier, X., Veillerot, M., Martinez, E., Barnes, J.-P.
Published in Surface and interface analysis (01.02.2014)

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Characterization of advanced ALD-based thin film barriers for organic electronics using ToF-SIMS analysis

by Terlier, T., Maindron, T., Barnes, J.-P., Léonard, D.
Published in Organic electronics (01.08.2018)

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Investigation of block depth distribution in PS- b -PMMA block copolymer using ultra-low-energy cesium sputtering in ToF-SIMS: Investigation of block depth distribution in PS- b -PMMA using ToF-SIMS

by Terlier, T., Tiron, R., Gharbi, A., Chevalier, X., Veillerot, M., Martinez, E., Barnes, J.-P.
Published in Surface and interface analysis (01.02.2014)

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