Search Results - "Terada, Koshiro" :: K.UTB vyhledávací portál

Quantitative thickness measurement of polarity-inverted piezoelectric thin-film layer by scanning nonlinear dielectric microscopy

by Odagawa, Hiroyuki, Terada, Koshiro, Tanaka, Yohei, Nishikawa, Hiroaki, Yanagitani, Takahiko, Cho, Yasuo
Published in Japanese Journal of Applied Physics (01.10.2017)

Get full text

Journal Article

Loading…

Method for measuring polarity-inverted layered structure in dielectric thin films using scanning nonlinear dielectric microscopy

by Odagawa, Hiroyuki, Terada, Koshiro, Nishikawa, Hiroaki, Yanagitani, Takahiko, Cho, Yasuo
Published in Ferroelectrics (31.08.2016)

Get full text

Journal Article

Quantitative thickness measurement of polarity-inverted piezoelectric thin-film layer by scanning nonlinear dielectric microscopy

Method for measuring polarity-inverted layered structure in dielectric thin films using scanning nonlinear dielectric microscopy

Refine Results

Format

Subject Area

Topic

Language

Year of Publication

Database