Revisiting MOSFET threshold voltage extraction methods
Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Muci, Juan, Terán Barrios, Alberto, Liou, Juin J., Ho, Ching-Sung
Published in Microelectronics and reliability (01.01.2013)
Published in Microelectronics and reliability (01.01.2013)
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Journal Article
Approximate analytical expression for the tersminal voltage in multi-exponential diode models
Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Terán Barrios, Alberto, Muci, Juan, de Souza, Michelly, Pavanello, Marcelo A.
Published in Solid-state electronics (01.11.2013)
Published in Solid-state electronics (01.11.2013)
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Journal Article