AI-Powered Multi-Class Defect Segmentation in Industrial CT Data
Schanz, Tim, Tenscher-Philipp, Robin, Marschall, Fabian, Simon, Martin
Published in E-journal of Nondestructive Testing (01.03.2023)
Published in E-journal of Nondestructive Testing (01.03.2023)
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Conference proceedings KI4Industry AI for SMEs -- The online congress for practical entry into AI for SMEs
Arnemann, Michael, Beckemeier, Per Olof, Bertram, Thomas, Eder, Michael, Erschig, Maximilian, Feiner, Matthias, Garcia, Francisco Javier Fernandez, Foerster, Frederic, Haas, Ruediger, Kipfmueller, Martin, Kotschenreuther, Jan, Langer, Bernd, Rodriguez, Ivan Lozada, Meibert, Thomas, Ottenhaus, Simon, Paschek, Stefan, Pfotzer, Lars, Roth, Michael M, Schanz, Tim, Scherer, Philip, Schwienke, Janine, Simon, Martin, Tenscher-Philipp, Robin
Year of Publication 14.06.2021
Year of Publication 14.06.2021
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Journal Article
Conference proceedings KI4Industry AI for SMEs -- The online congress for practical entry into AI for SMEs
Arnemann, Michael, Beckemeier, Per Olof, Bertram, Thomas, Eder, Michael, Erschig, Maximilian, Feiner, Matthias, Fernandez Garcia, Francisco Javier, Foerster, Frederic, Haas, Ruediger, Kipfmueller, Martin, Kotschenreuther, Jan, Langer, Bernd, Ivan Lozada Rodriguez, Meibert, Thomas, Ottenhaus, Simon, Paschek, Stefan, Pfotzer, Lars, Roth, Michael M, Schanz, Tim, Scherer, Philip, Schwienke, Janine, Martin, Simon, Tenscher-Philipp, Robin
Published in arXiv.org (05.08.2021)
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Published in arXiv.org (05.08.2021)
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