CpK approach for the qualification of ECC-designs with single bit failures
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Conference Proceeding
Failure Rate Prediction and Accelerated Detection of Anomalous Charge Loss in Flash Memories by Using an Analytical Transient Physics-Based Charge Loss Model
Schuler, Franz, Tempel, Georg, Melzner, Hanno, Jacob, Michael, Hendrickx, Paul, Wellekens, Dirk, Van Houdt, Jan
Published in Japanese Journal of Applied Physics (2002)
Published in Japanese Journal of Applied Physics (2002)
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Journal Article
Modeling Erratic Bits Temperature Dependence for Monte Carlo Simulation of Flash Arrays
Zambelli, C., Koebernik, G., Ullmann, R., Bauer, M., Tempel, G., Olivo, P.
Published in IEEE electron device letters (01.03.2013)
Published in IEEE electron device letters (01.03.2013)
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Journal Article
Analytical percolation model for predicting anomalous charge loss in flash memories
Degraeve, R., Schuler, F., Kaczer, B., Lorenzini, M., Wellekens, D., Hendrickx, P., van Duuren, M., Dormans, G.J.M., Van Houdt, J., Haspeslagh, L., Groeseneken, G., Tempel, G.
Published in IEEE transactions on electron devices (01.09.2004)
Published in IEEE transactions on electron devices (01.09.2004)
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Journal Article
Erratic bits classification for efficient repair strategies in automotive embedded flash memories
Zambelli, C., Olivo, P., Koebernik, G., Ullmann, R., Bauer, M., Tempel, G.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
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Conference Proceeding
Development of sub-10-nm atomic layer deposition barriers for Cu/low- k interconnects
Beyer, Gerald, Satta, Alessandra, Schuhmacher, Jörg, Maex, Karen, Besling, Wim, Kilpela, Olli, Sprey, Hessel, Tempel, Georg
Published in Microelectronic engineering (01.10.2002)
Published in Microelectronic engineering (01.10.2002)
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Journal Article
Conference Proceeding