Analysis and optimization of program disturb in split-gate cells using source side injection and impact on further cell size reduction
Bukethal, Christoph, Tempel, Georg, Strenz, Robert, Power, John
Published in 2013 International Semiconductor Conference Dresden - Grenoble (ISCDG) (01.09.2013)
Published in 2013 International Semiconductor Conference Dresden - Grenoble (ISCDG) (01.09.2013)
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