by Blumberg, C, Wefers, F, Tegude, F.-J, Weimann, N, Prost, W
Published in CrystEngComm (2019)

by Blumberg, C, Liborius, L, Ackermann, J, Tegude, F.-J, Poloczek, A, Prost, W, Weimann, N
Published in CrystEngComm (21.02.2020)

by Regolin, I., Gutsche, C., Lysov, A., Blekker, K., Li, Zi-An, Spasova, M., Prost, W., Tegude, F.-J.
Published in Journal of crystal growth (01.01.2011)

by Do, Q.-T., Blekker, K., Regolin, I., Prost, W., Tegude, F.J.
Published in IEEE electron device letters (01.08.2007)

by Regolin, I., Sudfeld, D., Lüttjohann, S., Khorenko, V., Prost, W., Kästner, J., Dumpich, G., Meier, C., Lorke, A., Tegude, F.-J.
Published in Journal of crystal growth (2007)

by Lysov, A, Offer, M, Gutsche, C, Regolin, I, Topaloglu, S, Geller, M, Prost, W, Tegude, F-J
Published in Nanotechnology (25.02.2011)

by Brönstrup, G, Leiterer, C, Jahr, N, Gutsche, C, Lysov, A, Regolin, I, Prost, W, Tegude, F J, Fritzsche, W, Christiansen, S
Published in Nanotechnology (23.09.2011)

by Topaloglu, S., Prost, W., Tegude, F.-J.
Published in Microelectronic engineering (01.07.2011)

by Vinaji, S, Lochthofen, A, Mertin, W, Regolin, I, Gutsche, C, Prost, W, Tegude, F J, Bacher, G
Published in Nanotechnology (23.09.2009)

by Jin, Z., Uchida, K., Nozaki, S., Prost, W., Tegude, F.-J.
Published in Applied surface science (31.08.2006)

by Pacha, C., Auer, U., Burwick, C., Glosekotter, P., Brennemann, A., Prost, W., Tegude, F.-J., Goser, K.F.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.10.2000)

by TOPALOGLU, S, PROST, W, TEGUDE, F.-J
Published in Microelectronic engineering (01.07.2011)

by MATISS, A, PROST, W, TEGUDE, F.-J
Published in Electronics letters (11.05.2006)

by Jin, Z., Neumann, S., Prost, W., Tegude, F.-J.
Published in IEEE transactions on electron devices (01.06.2004)

by Jin, Z., Liu, X., Prost, W., Tegude, F.-J.
Published in Solid-state electronics (01.07.2008)

by Gutsche, C., Lysov, A., Regolin, I., Münstermann, B., Prost, W., Tegude, F. J.
Published in Journal of electronic materials (01.05.2012)

by Prost, W., Khorenko, V., Mofor, A.-C., Neumann, S., Poloczek, A., Matiss, A., Bakin, A., Schlachetzki, A., Tegude, F.-J.
Published in Applied physics. A, Materials science & processing (01.06.2007)

by Auer, U., Prost, W., Agethen, M., Tegude, F.-J., Duschl, R., Eberl, K.
Published in IEEE electron device letters (01.05.2001)

by Neumann, S., Velling, P., Prost, W., Tegude, F.-J.
Published in Journal of crystal growth (01.12.2004)

by Ahl, J.-P., Behmenburg, H., Giesen, C., Regolin, I., Prost, W., Tegude, F. J., Radnoczi, G. Z., Pécz, B., Kalisch, H., Jansen, R. H., Heuken, M.
Published in Physica status solidi. C (01.07.2011)