Introduction to Analog Testing of Resistive Random Access Memory (RRAM) Devices Towards Scalable Analog Compute Technology for Deep Learning
Pujari, Ruturaj, Gasasira, Arthur, Kim, Youngseok, Katragadda, Veenadhar, Seo, Soon-Cheon, Kong, Dexin, Liu, Xuefeng, Teehan, Sean, Saulnier, Nicole, Ahsan, Ishtiaq, Narayanan, Vijay, Ando, Takashi
Published in 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (10.05.2021)
Published in 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (10.05.2021)
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Conference Proceeding
High-throughput, nondestructive assessment of defects in patterned epitaxial films on silicon by machine learning-enabled broadband plasma optical measurements
Matham, Shravan, Durfee, Curtis, Mendoza, Brock, Sadana, Devendra K, Bedell, Stephen W, Gaudiello, John, Teehan, Sean, Choi, HeungSoo, Jain, Ankit, Plihal, Martin
Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
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Conference Proceeding
Thermoelectric Performance of ZnO:Al/ZnO:(Al,In) Quantum Well Multilayer Structures as a Function of Indium Composition and Band-Gap Offset at High Operating Temperatures
Teehan, Sean, Efstathiadis, Harry, Haldar, Pradeep
Published in Journal of electronic materials (01.06.2012)
Published in Journal of electronic materials (01.06.2012)
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Journal Article
Conference Proceeding
Gas cluster ion beam processing for improved self aligned contact yield at 7 nm node FinFET: MJ: MOL and junction interfaces
Fan, Su Chen, Teehan, Sean, Chung, Kisup, Varghese, Alex, Lenhardt, Mark, Montanini, Pietro, Skordas, Spyridon, Haran, Bala, Tsai, Stan, Xie, Ruilong
Published in 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.04.2018)
Published in 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.04.2018)
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Conference Proceeding