Formation of quasi-free-standing graphene on SiC(0001) through intercalation of erbium
Bentley, P. D., Bird, T. W., Graham, A. P. J., Fossberg, O., Tear, S. P., Pratt, A.
Published in AIP advances (01.02.2021)
Published in AIP advances (01.02.2021)
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Hallmark of quantum skipping in energy filtered lensless scanning electron microscopy
Thamm, A.-K., Wei, J., Zhou, J., Walker, C. G. H., Cabrera, H., Demydenko, M., Pescia, D., Ramsperger, U., Suri, A., Pratt, A., Tear, S. P., El-Gomati, M. M.
Published in Applied physics letters (31.01.2022)
Published in Applied physics letters (31.01.2022)
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A medium-energy ion scattering investigation of the structure and surface vibrations of two-dimensional YSi2 grown on Si(111)
WOOD, T. J, BONET, C, NOAKES, T. C. Q, BAILEY, P, TEAR, S. P
Published in Surface science (20.12.2005)
Published in Surface science (20.12.2005)
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A medium-energy ion scattering study of the Si(111)(√3×√3)R30°- Pb (β-phase) surface
Spence, D J, Tear, S P, Bailey, P, Noakes, T C Q
Published in Journal of physics. Condensed matter (05.06.2000)
Published in Journal of physics. Condensed matter (05.06.2000)
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Journal Article
A low-energy electron diffraction analysis of the structure of the titanium dioxide (001) surface
Mason, C G, Tear, S P, Doust, T N, Thornton, G
Published in Journal of physics. Condensed matter (01.11.1991)
Published in Journal of physics. Condensed matter (01.11.1991)
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Conference Proceeding
STM studies of the RT Pb-Si(111) interface structure
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Journal Article
Conference Proceeding
Scanning Field Emission Microscopy with Spin and Energy Analysis
Thamm, A-K, Wei, J., Demydenko, M., Walker, C. G. H., Pescia, D., Ramsperger, U., Pratt, A., Tear, S. P., El Gomati, M. M.
Published in 2021 34th International Vacuum Nanoelectronics Conference (IVNC) (05.07.2021)
Published in 2021 34th International Vacuum Nanoelectronics Conference (IVNC) (05.07.2021)
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Conference Proceeding
Monte Carlo Modeling of the Low-loss Electron Signal in Scanning Electron Microscopy and Comparison with the BSE Signal
Bonet, C, Pratt, A, El-Gomati, M, Matthew, JAD, Tear, SP
Published in Microscopy and microanalysis (01.08.2008)
Published in Microscopy and microanalysis (01.08.2008)
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Journal Article
Secondary, Backscattered and Low Energy Loss electrons in the SEM: Quantification for nano analysis
El-Gomati, MM, Walker, CGH, Bonet, C, Tear, SP, Matthew, JAD
Published in Microscopy and microanalysis (01.08.2008)
Published in Microscopy and microanalysis (01.08.2008)
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Journal Article
Structure and growth of the K/Ge(100)-(2 × 1) surface
Curson, N.J., Walton, J.M., Tear, S.P., McCash, E.M., Allison, W.
Published in Surface science (20.04.1994)
Published in Surface science (20.04.1994)
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