Radio-frequency reflectometry—A fast and sensitive measurement method for two-dimensional systems
Taskinen, L.J., Starrett, R.P., Martin, T.P., Chen, J.C.H., Micolich, A.P., Hamilton, A.R., Simmons, M.Y., Ritchie, D.A., Pepper, M.
Published in Physica. E, Low-dimensional systems & nanostructures (01.02.2010)
Published in Physica. E, Low-dimensional systems & nanostructures (01.02.2010)
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