A Methodology to Correct in-Fixture Measurement of Impedance by a Machine Learning Model
Fang, Bo-Siang, Lai, Chia-Chu, Lu, Ying-Wei, Chen, Kuan-Ta, Tasi, Mike, Jiang, Don-Son
Published in 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) (01.05.2019)
Published in 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) (01.05.2019)
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