by Karboyan, S., Tartarin, J.G., Rzin, M., Brunel, L., Curutchet, A., Malbert, N., Labat, N., Carisetti, D., Lambert, B., Mermoux, M., Romain-Latu, E., Thomas, F., Bouexière, C., Moreau, C.
Published in Microelectronics and reliability (01.09.2013)

by Graffeuil, J., Escotte, L., Tartarin, J. G.
Published in IEEE transactions on electron devices (01.12.2019)

by Tartarin, J G, Wong, K W
Published in Semiconductor science and technology (01.01.2007)

by Said, N., Harrouche, K., Medjdoub, F., Labat, N., Tartarin, J.G., Malbert, N.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)

by Nsele, S. D., Escotte, L., Tartarin, J.-G, Piotrowicz, S.
Published in 2013 22nd International Conference on Noise and Fluctuations (ICNF) (01.06.2013)

by Borgarino, M., Tartarin, J.G., Kuchenbecker, J., Parra, T., Lafontaine, H., Kovacic, T., Plana, R., Graffeuil, J.
Published in IEEE microwave and guided wave letters (01.11.2000)

by Escotte, L., Tartarin, J.-G., Graffeuil, J.
Published in IEEE transactions on instrumentation and measurement (01.08.1999)

by Pinault, B., Tartarin, J.G., Saugnon, D., Leblanc, R.
Published in Microelectronics and reliability (01.11.2023)

by Tartarin, J.G.
Published in Microelectronics and reliability (01.09.2019)

by Said, N., Harrouche, K., Medjdoub, F., Labat, N., Tartarin, J.G., Malbert, N.
Published in Microelectronics and reliability (01.11.2023)

by Tartarin, J.G., Lazar, O., Rumeau, A., Franc, B., Bary, L., Lambert, B.
Published in Microelectronics and reliability (01.11.2020)

by Nsele, S. D., Tartarin, J. G., Escotte, L., Piotrowicz, S., Delage, S.
Published in 2015 International Conference on Noise and Fluctuations (ICNF) (01.06.2015)

by Tartarin, J.-G., Soubercaze-Pun, G., Bary, L., Chambon, C., Gribaldo, S., Llopis, O., Escotte, L., Plana, R., Delage, S., Gaquiere, C., Graffeuil, J.
Published in European Gallium Arsenide and Other Semiconductor Application Symposium, GAAS 2005 (2005)

by Nsele, S. D., Robin, C., Tartarin, J. G., Escotte, L., Piotrowicz, S., Jardel, O., Delage, S.
Published in 2015 International Conference on Noise and Fluctuations (ICNF) (01.06.2015)

by Escotte, L., Grenier, K., Tartarin, J.G., Graffeuil, J.
Published in IEEE transactions on microwave theory and techniques (01.11.1998)

by Tartarin, J.G., Lazar, O., Saugnon, D., Lambert, B., Moreau, C., Bouexiere, C., Romain-Latu, E., Rousseau, K., David, A., Roux, J.L.
Published in Microelectronics and reliability (01.09.2017)

by Lazăr, O., Tartarin, J.G., Lambert, B., Moreau, C., Roux, J.L.
Published in Microelectronics and reliability (01.08.2015)

by Escotte, L., Tartarin, J.G., Plana, R., Graffeuil, J.
Published in Solid-state electronics (01.04.1998)

by Graffeuil, J., Bary, L., Rayssac, J., Tartarin, J.-G., Lopez, L.
Published in IEEE transactions on device and materials reliability (01.09.2007)

by Lambert, B., Labat, N., Carisetti, D., Karboyan, S., Tartarin, J.G., Thorpe, J., Brunel, L., Curutchet, A., Malbert, N., Latu-Romain, E., Mermoux, M.
Published in Microelectronics and reliability (01.09.2012)