by Aziza, H., Moreau, M., Fieback, M., Taouil, M., Hamdioui, S.
Published in IEEE access (2020)

by Aziza, H., Hamdioui, S., Fieback, M., Taouil, M., Moreau, M.
Published in 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.02.2021)

by Yuan, S., Zhang, Z., Fieback, M., Xun, H., Marinissen, E. J., Kar, G. S., Rao, S., Couet, S., Taouil, M., Hamdioui, S.
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)

by Jenihhin, M., Hamdioui, S., Reorda, M. Sonza, Krstic, M., Langendorfer, P., Sauer, C., Klotz, A., Huebner, M., Nolte, J., Vierhaus, H. T., Selimis, G., Alexandrescu, D., Taouil, M., Schrijen, G. J., Raik, J., Sterpone, L., Squillero, G., Dyka, Z.
Published in 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2020)

by Aziza, H., Postel-Pellerin, J., Fieback, M., Hamdioui, S., Xun, H., Taouil, M., Coulie, K., Rahajandraibe, W.
Published in 2024 IEEE 25th Latin American Test Symposium (LATS) (09.04.2024)

by Copetti, T. S., Chordia, A., Fieback, M., Taouil, M., Hamdioui, S., Bolzani Poehls, L. M.
Published in 2024 IEEE 25th Latin American Test Symposium (LATS) (09.04.2024)

by Medeiros, G. C., Fieback, M., Gebregiorgis, A., Taouil, M., Poehls, L. B., Hamdioui, S.
Published in 2022 IEEE European Test Symposium (ETS) (23.05.2022)

by Medeiros, G. Cardoso, Fieback, M., Gebregiorgis, A., Taouil, M., Poehls, L. Bolzani, Hamdioui, S.
Published in 2021 IEEE European Test Symposium (ETS) (24.05.2021)

by Medeiros, G. C., Fieback, M., Copetti, T. S., Gebregiorgis, A., Taouil, M., Poehls, L. B., Hamdioui, S.
Published in 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (28.06.2021)

by Vatajelu, Elena Ioana, Prinetto, Paolo, Taouil, Mottaqiallah, Hamdioui, Said
Published in IEEE transactions on emerging topics in computing (01.07.2019)

by Medeiros, G.C., Bolzani Poehls, L.M., Taouil, M., Luis Vargas, F., Hamdioui, S.
Published in Microelectronics and reliability (01.09.2018)

by Martin, Honorio, Peris-Lopez, Pedro, Natale, Giorgio, Taouil, Mottaqiallah, Hamdioui, Said
Published in Electronics (Basel) (01.02.2019)

by Taouil, M, Hamdioui, S, Beenakker, K, Marinissen, E J
Published in 2010 19th IEEE Asian Test Symposium (01.12.2010)

by Hamdioui, S., Taouil, M.
Published in 2011 Asian Test Symposium (01.11.2011)

by Taouil, M, Hamdioui, S, Verbree, J, Marinissen, E J
Published in 2010 IEEE International Test Conference (01.11.2010)

by Kraak, D.H.P., Gursoy, C.C., Agbo, I.O., Taouil, M., Jenihhin, M., Raik, J., Hamdioui, S.
Published in 2019 IEEE Latin American Test Symposium (LATS) (01.03.2019)

by Taouil, M., Hamdioui, S.
Published in 2011 Sixteenth IEEE European Test Symposium (01.05.2011)

by Taouil, M., Hamdioui, S.
Published in 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (01.05.2012)

by Taouil, M, Hamdioui, S
Published in 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (01.04.2011)

by Kuzmanov, G., Taouil, M.
Published in 2009 International Conference on Field-Programmable Technology (01.12.2009)