Comprehensive Analysis of Gate Oxide Short in Junctionless Fin Field Effect Transistor
Rahman, Md Wahidur, Alias, N. Ezaila, Hamzah, Afiq, Peng Tan, M. L., Kamisian, Izam
Published in 2022 IEEE International Conference on Semiconductor Electronics (ICSE) (15.08.2022)
Published in 2022 IEEE International Conference on Semiconductor Electronics (ICSE) (15.08.2022)
Get full text
Conference Proceeding
Negative Bias Temperature Instability Analysis of a 15 nm p-channel Junctionless Fin Field Effect Transistor (p-JLFinFET)
Hamzah, M. Naziiruddin, Alias, N. Ezaila, Peng Tan, M. L.
Published in 2022 IEEE 20th Student Conference on Research and Development (SCOReD) (08.11.2022)
Published in 2022 IEEE 20th Student Conference on Research and Development (SCOReD) (08.11.2022)
Get full text
Conference Proceeding
Performance Analysis of 14nm SOI-based Trigate Gaussian Channel Junctionless FinFET with Punchthrough Stop Layer
Ramakrishnan, Mathangi, Alias, N. Ezaila, Tan, M. L. Peng, Hamzah, Afiq, Wahab, Yasmin Abdul, Hussin, Hanim
Published in 2023 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) (28.08.2023)
Published in 2023 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) (28.08.2023)
Get full text
Conference Proceeding
An Efficient March (5n) FSM-Based Memory Built-In Self Test (MBIST) Architecture
Nguan Kong, T. S., Alias, N. Ezaila, Hamzah, Afiq, Kamisian, Izam, Peng Tan, M. L., Sheikh, U. Ullah, Wahab, Yasmin Abdul
Published in 2021 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) (02.08.2021)
Published in 2021 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) (02.08.2021)
Get full text
Conference Proceeding
Reliability Analysis Of Gate-All-Around Floating Gate (GAA-FG) With Variable Oxide Thickness For Flash Memory Cell
Hamid, Farah, Alias, N. Ezaila, Hamzah, Afiq, Johari, Zaharah, Tan, M. L. Peng, Ismail, Razali, Soin, Norhayati
Published in 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (01.04.2020)
Published in 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (01.04.2020)
Get full text
Conference Proceeding
Temperature Variation Operation of Mixed-VT 3T GC-eDRAM for Low Power Applications in 2Kbit Memory Array
Abdo, Hussien, Alias, N. Ezaila, Hamzah, Afiq, Kamisian, Izam, Tan, M. L. Peng, Sheikh, U. Ullah
Published in International Journal of Integrated Engineering (20.06.2022)
Published in International Journal of Integrated Engineering (20.06.2022)
Get full text
Journal Article
Reliability Analysis of Multibridge Channel Field Effect Transistor
Ganlin, Huang, Alias, N. Ezaila, Tan, M. L. Peng, Hamzah, M. N., Wahab, Yasmin Abdul, Hussin, Hanim
Published in 2024 IEEE International Conference on Semiconductor Electronics (ICSE) (19.08.2024)
Published in 2024 IEEE International Conference on Semiconductor Electronics (ICSE) (19.08.2024)
Get full text
Conference Proceeding
Analysis of the Electrical Characteristics for Compact SPICE Modelling of STT-MTJ Device with Physical Parameters Variation
Pai, M. Y. Xuan, Alias, N. Ezaila, Tan, M. L. Peng, Hamzah, Afiq, Wahab, Yasmin Abdul, Muhamad, Maizan
Published in 2024 IEEE International Conference on Semiconductor Electronics (ICSE) (19.08.2024)
Published in 2024 IEEE International Conference on Semiconductor Electronics (ICSE) (19.08.2024)
Get full text
Conference Proceeding
Performance Analysis of Junctionless Multi-Bridge Channel FET with Strained SiGe Application
Affandi, S. Afidah, Alias, N. Ezaila, Hamzah, Afiq, Tan, M.L Peng, Hussin, Hanim
Published in 2022 IEEE International Conference on Semiconductor Electronics (ICSE) (15.08.2022)
Published in 2022 IEEE International Conference on Semiconductor Electronics (ICSE) (15.08.2022)
Get full text
Conference Proceeding
A 2 Kbit Memory Array of Mixed-VT GC-eDRAM Implemented in 130nm Standard CMOS Technology
Abdo, Hussien, Alias, N. Ezaila, Hamzah, Afiq, Kamisian, Izam, Peng Tan, M. L., Sheikh, U. Ullah
Published in 2021 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) (02.08.2021)
Published in 2021 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) (02.08.2021)
Get full text
Conference Proceeding