General Efficient TMR for Combinational Circuit Hardening Against Soft Errors and Improved Multi-Objective Optimization Framework
Tan, Chiyu, Li, Yan, Cheng, Xu, Han, Jun, Zeng, Xiaoyang
Published in IEEE transactions on circuits and systems. I, Regular papers (01.07.2021)
Published in IEEE transactions on circuits and systems. I, Regular papers (01.07.2021)
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Journal Article
A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application
Li, Yan, Cheng, Xu, Tan, Chiyu, Han, Jun, Zhao, Yuanfu, Wang, Liang, Li, Tongde, Tahoori, Mehdi B., Zeng, Xiaoyang
Published in IEEE transactions on circuits and systems. II, Express briefs (01.09.2020)
Published in IEEE transactions on circuits and systems. II, Express briefs (01.09.2020)
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Journal Article