Hot-electron-stress degradation in unpassivated GaN/AlGaN/GaN HEMTs on SiC
Meneghesso, G., Pierobon, R., Rampazzo, F., Tamiazzo, G., Zanoni, E., Bernat, J., Kordos, P., Basile, A.F., Chini, A., Verzellesi, G.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
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Conference Proceeding
Failure mechanisms of gallium nitride LEDs related with passivation
Meneghini, M., Trevisanello, L.R., Levada, S., Meneghesso, G., Tamiazzo, G., Zanoni, E., Zahner, T., Zehnder, U., Harle, V., Straus, U.
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)
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Conference Proceeding