A multicentre study on epidemiology and prevention of needle stick injuries among students of nursing schools
Veronesi, L, Giudice, L, Agodi, A, Arrigoni, C, Baldovin, T, Barchitta, M, Benedetti, T, Caggiano, G, Cannizzaro, S G, De Giglio, O, D'Errico, M, Destri, S, Fiorentini, R, Gentile, L, Mannone, A, Mascipinto, S, Mercuri, M, Montagna, M T, Novati, R, Oriani, R, Ortolani, S, Pennino, F, Ripabelli, G, Rossini, A, Sammarco, M L, Sodano, L, Squeri, R, Tamarri, F, Tamburro, M, Torre, I, Troiani, S, Pasquarella, C
Published in Annali di igiene (01.09.2018)
Published in Annali di igiene (01.09.2018)
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Journal Article
Ion implantation and activation of aluminum in bulk 3C-SiC and 3C-SiC on Si
Torregrosa, F., Canino, M., Li, F., Tamarri, F., Roux, B., Morata, S., La Via, F., Zielinski, M., Nipoti, R.
Published in MRS advances (01.12.2022)
Published in MRS advances (01.12.2022)
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Journal Article
Fabrication of Pt-Polysilicon Thin-Film Thermopiles: A Preliminary Study
Mancarella, F., Roncaglia, A., Tamarri, F., Pizzochero, G., Cardinali, G.C., Severi, M.
Published in IEEE Sensors, 2005 (2005)
Published in IEEE Sensors, 2005 (2005)
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Conference Proceeding
Syndromic Surveillance in Public Health Emergencies: A Systematic Analysis of Cases Related to Exposure to 2023 Floodwaters in Romagna, Italy
Montalti, Marco, Fabbri, Marco, Angelini, Raffaella, Bakken, Elizabeth, Morri, Michela, Tamarri, Federica, Reali, Chiara, Soldà, Giorgia, Silvestrini, Giulia, Lenzi, Jacopo
Published in Healthcare (Basel) (03.09.2024)
Published in Healthcare (Basel) (03.09.2024)
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Journal Article
Activation energy in the early stage of electromigration in Al-1% Si/TiN/Ti bamboo lines
Munari, I De, Scorzoni, A, Tamarri, F, Fantini, F
Published in Semiconductor science and technology (01.03.1995)
Published in Semiconductor science and technology (01.03.1995)
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Journal Article
Resistance changes due to Cu transport and precipitation during electromigration in submicrometric Al-0.5% Cu lines
Scorzoni, A., De Munari, I., Balboni, R., Tamarri, F., Garulli, A., Fantini, F.
Published in Microelectronics and reliability (01.11.1996)
Published in Microelectronics and reliability (01.11.1996)
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Conference Proceeding
Drawbacks to using NIST electromigration test-structures to test bamboo metal lines
De Munari, I., Scorzoni, A., Tamarri, F., Govoni, D., Corticelli, F., Fantini, F.
Published in IEEE transactions on electron devices (01.12.1994)
Published in IEEE transactions on electron devices (01.12.1994)
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Journal Article
Micromachined gas calibration sources based on nanometric depth microchannels
Zampolli, S., Elmi, I., Mancarella, F., Messina, M., Marra, G., Cozzani, E., Belluce, M., Tamarri, F., Sanmartin, M., Cardinali, G.C., Severi, M.
Published in Procedia engineering (2010)
Published in Procedia engineering (2010)
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Journal Article
A comparison among different technological processes for the fabrication of polysilicon-based thermoelectric transducers
Mancarella, F., Roncaglia, A., Tamarri, F., Elmi, I., Cardinali, G.C., Severi, M.
Published in 2006 5th IEEE Conference on Sensors (01.10.2006)
Published in 2006 5th IEEE Conference on Sensors (01.10.2006)
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Conference Proceeding
Activation energy in the early stage of electromigration in Al-1% Si/titanium nitride/titanium bamboo lines
Munari, I D, Scorzoni, A, Tamarri, F, Fantini, F
Published in Semiconductor science and technology (01.03.1995)
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Published in Semiconductor science and technology (01.03.1995)
Journal Article
Material Properties Measurement and Numerical Simulation for Characterization of Ultra-Low-Power Consumption Hotplates
Cozzani, E., Roncaglia, A., Zampolli, S., Elmi, I., Mancarella, F., Tamarri, F., Cardinali, G.C.
Published in TRANSDUCERS 2007 - 2007 International Solid-State Sensors, Actuators and Microsystems Conference (01.06.2007)
Published in TRANSDUCERS 2007 - 2007 International Solid-State Sensors, Actuators and Microsystems Conference (01.06.2007)
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Conference Proceeding
Resistance changes due to cu transport and precipitation during electromigration in submicrometric Al-0.5%Cu lines
Scorzoni, A., de Murani, I., Balboni, R., Tamarri, F., Garulli, A., Fantin, F.
Published in Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (1996)
Published in Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (1996)
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Conference Proceeding