by Tamarapalli, Nagesh, Vallur, Prashanth, Kulkarni, Sachin Sudhakar
Published in 2015 28th International Conference on VLSI Design (01.01.2015)

by Shukla, Rahul, Phong Loi, Margulis, Arie, Pham, Ken, Yang, Kathy, Tamarapalli, Nagesh
Published in 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems (01.01.2014)

by Mishra, Prabhat, Fujita, Masahiro, Singh, Virendra, Tamarapalli, Nagesh, Kumar, Sharad, Mittal, Rajesh
Published in 2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems (01.01.2013)

by Rajski, J., Tyszer, J., Kassab, M., Mukherjee, N., Thompson, R., Kun-Han Tsai, Hertwig, A., Tamarapalli, N., Mrugalski, G., Eide, G., Jun Qian
Published in Proceedings - International Test Conference (2002)

by Keim, M., Tamarapalli, N., Tang, H., Sharma, M., Rajski, J., Schuermyer, C., Benware, B.
Published in 2006 IEEE International Test Conference (01.10.2006)

by Rajski, J., Tamarapalli, N., Tyszer, J.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.2000)

by Hetherington, G., Fryars, T., Tamarapalli, N., Kassab, M., Hassan, A., Rajski, J.
Published in International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) (1999)

by Benware, B., Schuermyer, C., Tamarapalli, N., Kun-Han Tsai, Ranganathan, S., Madge, R., Rajski, J., Krishnamurthy, P.
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)

by Yu Huang, Wu-Tung Cheng, Tamarapalli, N., Rajski, J., Klingenberg, R.
Published in 2006 IEEE International Test Conference (01.10.2006)

by Leininger, A., Muhmenthaler, P., Wu-Tung Cheng, Tamarapalli, N., Wu Yang, Hans Tsai
Published in IEEE International Conference on Test, 2005 (2005)

by Abercrombie, D., Koenemann, B., Tamarapalli, N., Venkataraman, S.
Published in 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) (2006)

by Tamarapalli, N., Rajski, J.
Published in Proceedings International Test Conference 1996. Test and Design Validity (1996)

by Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Tamarapalli, N., Rajski, J.
Published in 13th Asian Test Symposium (2004)

by Leininger, A., Khoche, A., Fischer, M., Tamarapalli, N., Wu-Tung Cheng, Klingenberg, R., Wu Yang
Published in 2006 15th Asian Test Symposium (01.11.2006)

by Tendolkar, N., Belete, D., Schwarz, B., Podnar, B., Gupta, A., Karako, S., Wu-Tung Cheng, Babin, A., Kun-Han Tsai, Tamarapalli, N., Aldrich, G.
Published in 2006 IEEE International Test Conference (01.10.2006)

by Rajski, J., Tamarapalli, N., Tyszer, J.
Published in Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) (1998)

by Poehl, F., Beek, M., Tamarapalli, N., Kassab, M., Arnold, R., Muhmenthaler, P., Mukherjee, N., Rajski, J.
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)

by Rajski, Janusz, Tyszer, Jerzy, Tamarapalli, Nagesh
Year of Publication 28.09.2010

by TAMARAPALLI NAGESH, RAJSKI JANUSZ, TYSZER JERZY
Year of Publication 28.09.2010

by Shukla, Rahul, Billings, Richard, Bakhshi, Anurag, Schulze, John, Gorti, Atchyuth, Tamarapalli, Nagesh
Published in Illumina Technology Records - unstructured (01.01.2011)