Electron backscatter diffraction analysis of electrodeposited nano-scale copper wires
Ke, Y., Konkova, T., Mironov, S., Tamahashi, K., Onuki, J.
Published in Thin solid films (31.07.2013)
Published in Thin solid films (31.07.2013)
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Journal Article
(Invited) Resistivity Reduction in Very Narrow Cu Wiring
Onuki, Jin, Sasajima, Yasushi, Tamahashi, Kunihiro, YiQing, Ke, Terada, Shouhei, Hidaka, Kishio
Published in ECS transactions (01.01.2012)
Published in ECS transactions (01.01.2012)
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Journal Article
EBSD Analysis of Microstructures Along the Depth Direction in Very Narrow Cu Wires
Ke, Y, Namekawa, T, Tamahashi, K, Inami, T, Onuki, J
Published in Denki kagaku oyobi kōgyō butsuri kagaku (01.04.2013)
Published in Denki kagaku oyobi kōgyō butsuri kagaku (01.04.2013)
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Journal Article