Measurement of neutron-induced single event transient pulse width narrower than 100ps
Nakamura, H, Tanaka, K, Uemura, T, Takeuchi, K, Fukuda, T, Kumashiro, S
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
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Conference Proceeding
Semaphorin3A-induced axonal transport mediated through phosphorylation of Axin-1 by GSK3β
Hida, Tomonobu, Nakamura, Fumio, Usui, Hiroshi, Takeuchi, Kan, Yamashita, Naoya, Goshima, Yoshio
Published in Brain research (19.02.2015)
Published in Brain research (19.02.2015)
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Journal Article
Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators
Takeuchi, Kan, Shimada, Masaki, Okagaki, Takeshi, Shibutani, Koji, Nii, Koji, Tsuchiya, Fumio
Published in IET circuits, devices & systems (01.03.2018)
Published in IET circuits, devices & systems (01.03.2018)
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Journal Article
An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology
Igarashi, Mitsuhiko, Takeuchi, Kan, Okagaki, Takeshi, Shibutani, Koji, Matsushita, Hiroaki, Nii, Koji
Published in ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC) (01.09.2015)
Published in ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC) (01.09.2015)
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Conference Proceeding
Journal Article
Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance
Takeuchi, Kan, Shimada, Masaki, Konishi, Shinya, Oshida, Daisuke, Ota, Naoya, Yasumasu, Takashi, Shibutani, Koji, Iwashita, Tomohiro, Kokubun, Tetsuya, Tsuchiya, Fumio
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs
Takeuchi, Kan, Shimada, Masaki, Okagaki, Takeshi, Shibutani, Koji, Nii, Koji, Tsuchiya, Fumio
Published in ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference (01.09.2016)
Published in ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference (01.09.2016)
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Conference Proceeding