Study of Local BTI Variation and its Impact on Logic Circuit and SRAM in 7 nm Fin-FET Process
Igarashi, Mitsuhiko, Uchida, Yuuki, Takazawa, Yoshio, Yabuuchi, Makoto, Tsukamoto, Yasumasa, Shibutani, Koji
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET
Igarashi, Mitsuhiko, Uchida, Yuuki, Takazawa, Yoshio, Tsukamoto, Yasumasa, Shibutani, Koji, Nii, Koji
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
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Conference Proceeding
SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, AND ELECTRONIC SYSTEM
SHIMADA MASAKI, TSUCHIYA FUMIO, TAKAZAWA YOSHIO, OTA NAOYA, OSHIDA DAISUKE, KONISHI SHINYA, TAKEUCHI MIKI
Year of Publication 25.03.2021
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Year of Publication 25.03.2021
Patent
A novel compact model of the product marginal yield and its application for performance maximization
Tsuda, Atsushi, Okagaki, Takeshi, Fujii, Masako, Tsutsui, Toshikazu, Takazawa, Yoshio, Shibutani, Koji, Ogasawara, Shigeo, Yokota, Miho, Onozawa, Kazunori
Published in 2014 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2014)
Published in 2014 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2014)
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Conference Proceeding
28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization
Igarashi, M., Takeuchi, K., Takazawa, Y., Igarashi, Y., Matsushita, H.
Published in Proceedings of the IEEE 2012 Custom Integrated Circuits Conference (01.09.2012)
Published in Proceedings of the IEEE 2012 Custom Integrated Circuits Conference (01.09.2012)
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Conference Proceeding
NBTI/PBTI separated BTI monitor with 4.2x sensitivity by standard cell based unbalanced ring oscillator
Igarashi, Mitsuhiko, Takazawa, Yoshio, Tsukamoto, Yasumasa, Takeuchi, Kan, Shibutani, Koji
Published in 2017 IEEE Asian Solid-State Circuits Conference (A-SSCC) (01.11.2017)
Published in 2017 IEEE Asian Solid-State Circuits Conference (A-SSCC) (01.11.2017)
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Conference Proceeding
Semiconductor device, electronic device and electronic system
Shimada, Masaki, Takazawa, Yoshio, Tsuchiya, Fumio, Konishi, Shinya, Takeuchi, Kan, Oshida, Daisuke, Ota, Naoya
Year of Publication 21.11.2023
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Year of Publication 21.11.2023
Patent
SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE AND ELECTRONIC SYSTEM
TAKAZAWA, Yoshio, TAKEUCHI, Kan, OSHIDA, Daisuke, OTA, Naoya, KONISHI, Shinya, SHIMADA, Masaki, TSUCHIYA, Fumio
Year of Publication 07.06.2023
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Year of Publication 07.06.2023
Patent
A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process
Igarashi, Mitsuhiko, Uchida, Yuuki, Takazawa, Yoshio, Tsukamoto, Yasumasa, Shibutani, Koji, Nii, Koji
Published in 2018 IEEE Asian Solid-State Circuits Conference (A-SSCC) (01.11.2018)
Published in 2018 IEEE Asian Solid-State Circuits Conference (A-SSCC) (01.11.2018)
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Conference Proceeding
Semiconductor integrated circuit and its testing method
TOSHIO, YAMADA, KAZUMASA, YANAGISAWA, YOSHIO, TAKAZAWA YOSHIO, TAKASHI, HAYASAKA
Year of Publication 01.01.2004
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Year of Publication 01.01.2004
Patent
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
AIZAWA, SHINYA, TAKAZAWA, YOSHIO, YAMADA, TOSHIO, UCHIDA, AKIHISA, MATSUI, TOSHIKAZU, SHIMADA, SHIGERU, SASAKI, TOSHIO
Year of Publication 13.11.2003
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Year of Publication 13.11.2003
Patent
SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE AND ELECTRONIC SYSTEM
TAKAZAWA, Yoshio, TAKEUCHI, Kan, OSHIDA, Daisuke, OTA, Naoya, KONISHI, Shinya, SHIMADA, Masaki, TSUCHIYA, Fumio
Year of Publication 24.03.2021
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Year of Publication 24.03.2021
Patent
SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE AND ELECTRONIC SYSTEM
TAKAZAWA, Yoshio, TAKEUCHI, Kan, OSHIDA, Daisuke, OTA, Naoya, KONISHI, Shinya, SHIMADA, Masaki, TSUCHIYA, Fumio
Year of Publication 18.03.2021
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Year of Publication 18.03.2021
Patent