Large Within-Die Gate Delay Variations in Sub-Threshold Logic Circuits at Low Temperature
Takahashi, R., Takata, H., Yasufuku, T., Fuketa, H., Takamiya, M., Nomura, M., Shinohara, H., Sakurai, T.
Published in IEEE transactions on circuits and systems. II, Express briefs (01.12.2012)
Published in IEEE transactions on circuits and systems. II, Express briefs (01.12.2012)
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Journal Article
Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs
Fukazawa, Mitsuya, Matsuno, Tetsuro, Uemura, Toshifumi, Akiyama, Rei, Kagemoto, Tetsuya, Makino, Hiroshi, Takata, Hidehiro, Nagata, Makoto
Published in 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (01.02.2007)
Published in 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (01.02.2007)
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Conference Proceeding
An Extended Direct Power Injection Method for In-Place Susceptibility Characterization of VLSI Circuits Against Electromagnetic Interference
Sawada, Takuya, Yoshikawa, Kumpei, Takata, Hidehiro, Nii, Koji, Nagata, Makoto
Published in IEEE transactions on very large scale integration (VLSI) systems (01.10.2015)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.10.2015)
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Journal Article
Decoupling capacitance boosting for on-chip resonant supply noise reduction
Jinmyoung Kim, Nakura, T, Takata, H, Ishibashi, K, Ikeda, M, Asada, K
Published in 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (01.04.2011)
Published in 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (01.04.2011)
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Conference Proceeding
Misleading energy and performance claims in sub/near threshold digital systems
Yu Pu, Xin Zhang, Huang, Jim, Muramatsu, Atsushi, Nomura, Masahiro, Hirairi, K, Takata, H, Sakurabayashi, T, Miyano, Shinji, Takamiya, M, Sakurai, T
Published in 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2010)
Published in 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2010)
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Conference Proceeding
Measurements of SRAM sensitivity against AC power noise with effects of device variation
Sawada, T., Yoshikawa, K., Takata, H., Nii, K., Nagata, M.
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
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Conference Proceeding
On-chip resonant supply noise reduction utilizing switched parasitic capacitors of sleep blocks with tri-mode power gating structure
Jinmyoung Kim, Nakura, T., Takata, H., Ishibashi, K., Ikeda, M., Asada, K.
Published in 2011 Proceedings of the ESSCIRC (ESSCIRC) (01.09.2011)
Published in 2011 Proceedings of the ESSCIRC (ESSCIRC) (01.09.2011)
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Conference Proceeding
Post-silicon programmed body-biasing platform suppressing device variability in 45 nm CMOS technology
Suzuki, Hiroaki, Kurimoto, Masanori, Yamanaka, Tadao, Takata, Hidehiro, Makino, Hiroshi, Shinohara, Hirofumi
Published in Proceeding of the 13th international symposium on Low power electronics and design (ISLPED '08) (11.08.2008)
Published in Proceeding of the 13th international symposium on Low power electronics and design (ISLPED '08) (11.08.2008)
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Conference Proceeding
Phase-adjustable error detection flip-flops with 2-stage hold driven optimization and slack based grouping scheme for dynamic voltage scaling
Kurimoto, Masanori, Suzuki, Hiroaki, Akiyama, Rei, Yamanaka, Tadao, Ohkuma, Haruyuki, Takata, Hidehiro, Shinohara, Hirofumi
Published in 2008 45th ACM/IEEE Design Automation Conference (08.06.2008)
Published in 2008 45th ACM/IEEE Design Automation Conference (08.06.2008)
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Conference Proceeding
A 99-mm super(2) 0.7-W single-chip MPEG-2 422PML video, audio, and system encoder with a 64-Mb embedded DRAM for portable 422PHL encoder system
Kumaki, Satoshi, Takata, Hidehiro, Ajioka, Yoshihide, Ooishi, Tsukasa, Ishihara, Kazuya, Hanami, Atsuo, Tsuji, Takaharu, Watanabe, Tetsuya, Morishima, Chikayoshi, Yoshizawa, Tomoaki, Sato, Hidenori, Hattori, Shin-Ichi, Koshio, Atsushi, Tsukamoto, Kazuhiro, Matsumura, Tetsuya
Published in IEEE journal of solid-state circuits (01.03.2002)
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Published in IEEE journal of solid-state circuits (01.03.2002)
Journal Article