by Tahoori, M.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.09.2006)

by Shazli, S.Z., Tahoori, M.B.
Published in Microelectronics and reliability (2010)

by Ebrahimpour, S, Shahbazi, M, Khalili, A, Tahoori, M T, Zavaran Hosseini, A, Amari, A, Aghili, B, Abediankenari, S, Mohammadizad, H, Mohammadnia-Afrouzi, M
Published in Journal of biological regulators and homeostatic agents (01.04.2017)

by TAHOORI, M. T, POURFATHOLLAH, A. A, AKHLAGHI, M, DANESHMANDI, S, NICKNAM, M. H, SOLEIMANIFAR, N
Published in Clinical and experimental rheumatology (01.09.2011)

by Tahoori, M., Nair, S.M., Bishnoi, R., Torres, L., Senni, S., Patrigeon, G., Benoit, P., Pendina, G. Di, Prenat, G.
Published in 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2020)

by Momenzadeh, M., Jing Huang, Tahoori, M.B., Lombardi, F.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2005)

by Tahoori, M.B., Jing Huang, Momenzadeh, M., Lombardi, F.
Published in IEEE transactions on nanotechnology (01.12.2004)

by Zhang, Z., Wu, Z., Weis, C., Wehn, N., Tahoori, M.
Published in 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS) (03.07.2023)

by Tahoori, M.B., Asadi, H., Mullins, B., Kaeli, D.R.
Published in Microelectronics and reliability (01.05.2009)

by Brackmann, L., Jafari, A., Bengel, C., Mayahinia, M., Waser, R., Wouters, D., Menzel, S., Tahoori, M.
Published in 2022 IEEE International Test Conference in Asia (ITC-Asia) (01.08.2022)

by Wouters, D. J., Brackmann, L., Jafari, A., Bengel, C., Mayahinia, M., Waser, R., Menzel, S., Tahoori, M.
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)

by Zhang, Z., Lappas, J., Chinazzo, A., Weis, C., Wu, Z., Ni, L., Wehn, N., Tahoori, M.
Published in 2022 IEEE European Test Symposium (ETS) (23.05.2022)

by Tahoori, M.B., Mitra, S.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.2005)

by Nair, S.M., Bishnoi, R., Tahoori, M. B., Grigoryan, H., Tshagharyan, G.
Published in 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2019)

by Jing Huang, Tahoori, M.B., Lombardi, F.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.07.2005)

by Momenzadeh, M., Jing Huang, Tahoori, M.B., Lombardi, F.
Published in IEEE transactions on nanotechnology (01.11.2005)

by Oboril, F., Tahoori, M. B.
Published in IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012) (01.06.2012)

by Nair, S. M., Bishnoi, R., Tahoori, M. B., Tshagharyan, G., Grigoryan, H., Harutyunyan, G., Zorian, Y.
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)

by Firouzi, F., Kiamehr, S., Tahoori, M. B.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2013)

by Tahoori, M. B.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.10.2011)