Testing of quantum cellular automata
Tahoori, M.B., Jing Huang, Momenzadeh, M., Lombardi, F.
Published in IEEE transactions on nanotechnology (01.12.2004)
Published in IEEE transactions on nanotechnology (01.12.2004)
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Journal Article
Obtaining FPGA soft error rate in high performance information systems
Tahoori, M.B., Asadi, H., Mullins, B., Kaeli, D.R.
Published in Microelectronics and reliability (01.05.2009)
Published in Microelectronics and reliability (01.05.2009)
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Journal Article
Application-independent testing of FPGA interconnects
Tahoori, M.B., Mitra, S.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.2005)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.2005)
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Journal Article
Variation-aware Fault Modeling and Test Generation for STT-MRAM
Nair, S.M., Bishnoi, R., Tahoori, M. B., Grigoryan, H., Tshagharyan, G.
Published in 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2019)
Published in 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2019)
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Conference Proceeding
Fault tolerance of switch blocks and switch block arrays in FPGA
Jing Huang, Tahoori, M.B., Lombardi, F.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.07.2005)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.07.2005)
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Journal Article
On the evaluation of scaling of QCA devices in the presence of defects at manufacturing
Momenzadeh, M., Jing Huang, Tahoori, M.B., Lombardi, F.
Published in IEEE transactions on nanotechnology (01.11.2005)
Published in IEEE transactions on nanotechnology (01.11.2005)
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Journal Article
Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM
Nair, S. M., Bishnoi, R., Tahoori, M. B., Tshagharyan, G., Grigoryan, H., Harutyunyan, G., Zorian, Y.
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
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Conference Proceeding
Automatic configuration generation for FPGA interconnect testing
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Conference Proceeding
High Resolution Application Specific Fault Diagnosis of FPGAs
Tahoori, M. B.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.10.2011)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.10.2011)
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Journal Article
Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications
Tshagharyan, G., Harutyunyan, G., Zorian, Y., Gebregiorgis, A., Golanbari, M. S., Bishnoi, R., Tahoori, M. B.
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
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Conference Proceeding
Soft Error Susceptibility Analysis of SRAM-Based FPGAs in High-Performance Information Systems
Asadi, H., Tahoori, M.B., Mullins, B., Kaeli, D., Granlund, K.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
NBTI mitigation by optimized NOP assignment and insertion
Firouzi, F., Kiamehr, S., Tahoori, M. B.
Published in 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2012)
Published in 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2012)
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Conference Proceeding
A mapping algorithm for defect-tolerance of reconfigurable nano-architectures
Tahoori, M. B.
Published in International Conference on Computer Aided Design: Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design; 06-10 Nov. 2005 (31.05.2005)
Published in International Conference on Computer Aided Design: Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design; 06-10 Nov. 2005 (31.05.2005)
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Conference Proceeding