Reliability issue of 20 nm MLC NAND Flash
Tae-Un Youn, Keum-Whan Noh, Sang-Mok Yi, Jong-Wook Kim, Noh-Yong Park, Sung-Chul Shin, Kwang-Hyun Yun, Byung-Kook Kim, Sung-Kye Park, Seok-Kiu Lee, Sung-Joo Hong
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
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Conference Proceeding
Field-dependent charge trapping analysis of ONO inter-poly dielectrics for NAND flash memory applications
Moon, Pyung, Lim, Jun Yeong, Youn, Tae-Un, Park, Sung-Kye, Yun, Ilgu
Published in Solid-state electronics (01.04.2014)
Published in Solid-state electronics (01.04.2014)
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Journal Article
Methodology for improvement of data retention in floating gate flash memory using leakage current estimation
Moon, Pyung, Lim, Jun Yeong, Youn, Tae-Un, Noh, Keum-Whan, Park, Sung-Kye, Yun, Ilgu
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding
A highly manufacturable integration technology of 20nm generation 64Gb multi-level NAND flash memory
Keun Woo Lee, Se Kyoung Choi, Sung Jae Chung, Hye Lyoung Lee, Su Min Yi, Byeong Il Han, Byung In Lee, Dong Hwan Lee, Ji Hyun Seo, Noh Yong Park, Hae Soo Kim, Hyung Seok Kim, Tae Un Youn, Keum Hwan Noh, Min Kyu Lee, Ju Yeab Lee, Kwang Hee Han, Won Sic Woo, Seok Won Cho, Seung Cheol Lee, Sung Soon Kim, Chan Sun Hyun, Weon Joon Suh, Sang Deok Kim, Myung Kyu Ahn, Hyeon Soo Kim, Ki Seog Kim, Gyu Seog Cho, Sung Kye Park, Aritome, S., Jin Woong Kim, Seok Kiu Lee, Sung Joo Hong, Sung Wook Park
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
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Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
Conference Proceeding
Optimization of control gate material and structure for enhancing 20nm 64Gb NAND flash reliability
Hae Soo Kim, Kang Jae Lee, Kwang Hee Han, Seok Won Cho, Se Kyoung Choi, Shin Won Seo, Jae Hyun Chung, Keun Woo Lee, Sung Jae Chung, Keum Hwan Noh, Tae Un Youn, Ju Yeab Lee, Min Kyu Lee, Byeong Il Han, Su Min Yi, Ho Seok Lee, Sung Soon Kim, Wan Sup Shin, Kwang Hyun Yun, Min Sung Ko, Jin Kwan Choi, Sang Wan Lee, Sang Deok Kim, Myung Kyu Ahn, Ki Seog Kim, Young Ho Jeon, Sung Kye Park, Aritome, Seiichi, Jin Woong Kim, Sang Sun Lee, Seok Kiu Lee, Kun Ok Ahn, Sung Joo Hong, Gi Hyun Bae, Sung Wook Park
Published in Proceedings of Technical Program of 2012 VLSI Technology, System and Application (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Technology, System and Application (01.04.2012)
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Conference Proceeding
Interlayer dielectric (ILD)-related edge channel effect in high density DRAM cell
KIM, Il-Gweon, KIM, Nam-Sung, CHOI, Se-Kyeong, YOUN, Tae-Un, JUNG, Hyuck-Chai, KWEON, Jae-Soon, CHUN, Young-Il, KIM, Wan-Soo, BONG, Myung-Jong, PARK, Joo-Seog
Published in Digest. International Electron Devices Meeting (2002)
Published in Digest. International Electron Devices Meeting (2002)
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Conference Proceeding
Spectrum of mucin-producing neoplastic conditions of the abdomen and pelvis：Cross-sectional imaging evaluation
Lee, Nam Kyung, Kim, Suk, Kim, Hyun Sung, Jeon, Tae Yong, Kim, Gwang Ha, Kim, Dong Uk, Park, Do Youn, Kim, Tae Un, Kang, Dae Hwan
Published in World journal of gastroenterology : WJG (21.11.2011)
Published in World journal of gastroenterology : WJG (21.11.2011)
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Journal Article