MEMS-based high speed scanning probe microscopy
Disseldorp, E C M, Tabak, F C, Katan, A J, Hesselberth, M B S, Oosterkamp, T H, Frenken, J W M, van Spengen, W M
Published in Review of scientific instruments (01.04.2010)
Published in Review of scientific instruments (01.04.2010)
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Journal Article
MEMS-based fast scanning probe microscopes
Tabak, F.C., Disseldorp, E.C.M., Wortel, G.H., Katan, A.J., Hesselberth, M.B.S., Oosterkamp, T.H., Frenken, J.W.M., van Spengen, W.M.
Published in Ultramicroscopy (01.05.2010)
Published in Ultramicroscopy (01.05.2010)
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Journal Article